MIL-PRF-19500/509D
* 4.3 Screening. Screening shall be in accordance with table E-IV of MIL-PRF-19500, and as specified herein.
The following measurements shall be made in accordance with table I herein. Devices that exceed the limits of table
I herein shall not be acceptable.
Screen (see table E-IV
Measurement
of MIL-PRF-19500)
JANS level
JANTX and JANTXV levels
(1) 3c
Thermal impedance, method 3131 of
Thermal impedance, method 3131 of
MIL-STD-750 (see 4.3.2)
MIL-STD-750 (see 4.3.2)
9
Not applicable
ICEX1 and hFE2
11
ICEX1 = 100 percent of initial value
ICEX1 and hFE2
or 1 µA dc, whichever is greater;
ĆhFE2 = ±25 percent of initial value
12
See 4.3.1
See 4.3.1
13
Subgroups 2 and 3 of table I herein;
Subgroup 2 of table I herein;
ĆICEX1 = 100 percent of initial value
ĆICEX1 = 100 percent of initial value or
or 1 µA dc, whichever is greater;
1 µA dc, whichever is greater;
ĆhFE2 = ±25 percent of initial value
ĆhFE2 = ±25 percent of initial value
(1) Shall be performed anytime after temperature cycling, screen 3a; and does not need to be repeated in
screening requirements.
4.3.1 Power burn-in conditions. Power burn-in conditions are as follows: VCB ≥ 20 V dc minimum; TJ =
*
+187.5°C ±12.5°C The selected IC and VCE values used for burn-in should fall within the safe operating area of 1.3
herein and on figures 2 and 3 herein.
* 4.3.2 Thermal impedance. The thermal impedance measurements shall be performed in accordance with
method 3131 of MIL-STD-750 using the guidelines in that method for determining IM, IH, tH, tSW (VC and VH where
appropriate). Measurement delay time (tMD) = 70 µs max. See table II, group E, subgroup 4 herein.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as
specified herein. Group A inspection shall be performed on each sublot.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500 and table I
herein. Electrical measurements (end-points) shall be in accordance with table I, subgroup 2 herein.
* 4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VIa (JANS) and table E-VIb (JAN, JANTX, and JANTXV) of MIL-PRF-19500 and 4.4.2.1
and 4.4.2.2 herein. Electrical measurements (end-points) shall be in accordance with table I, subgroup 2 herein.
*
4.4.2.1 Group B inspection, table E-VIa (JANS) of MIL-PRF-19500.
Subgroup
Method
Condition
B3
2037
Test condition A, all internal leads for each device shall be pulled separately.
VCE = 20 V dc, 2,000 cycles.
B4
1037
VCE = 20 V dc minimum; TJ = +275°C minimum; t = 96 hours.
B5
1027
6
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