MIL-PRF-19500/509D
* TABLE I. Group A inspection.
MIL-STD-750
Limits
Inspection 1/
Symbol
Unit
Method
Conditions
Min
Max
Subgroup 1
2071
Visual and mechanical
examination
Subgroup 2
°C/W
Thermal impedance
3131
See 4.3.2
ZθJX
Breakdown voltage,
3011
Bias condition D, IC = 50 mA dc
V(BR)CEO
collector to emitter
Pulsed (see 4.5.1)
2N6338
V dc
100
2N6341
150
V dc
µA dc
3041
Bias condition D
50
Collector to emitter
ICEO
cutoff current
VCE = 50 V dc
2N6338
VCE = 75 V dc
2N6341
µA dc
Emitter to base
3061
100
Bias condition D, VEB = 6 V dc
IEBO
cutoff current
collector to emitter
3041
Bias condition A, VBE = -1.5 V dc
ICEX1
cutoff current
VCB = 100 V dc
µA dc
10
2N6338
µA dc
10
2N6341
VCB = 150 V dc
Collector to base
3036
Bias condition D
ICBO
cutoff current
VCB = 120 V dc
µA dc
2N6338
10
VCB = 180 V dc
µA dc
2N6341
10
Base to emitter
3066
1.8
V dc
Test condition A; IB = 1.0 A dc;
VBE(SAT)
saturation voltage
IC = 10 A dc; pulsed (see 4.5.1)
3071
Collector to emitter
1.0
V dc
IB = 1.0 A dc; IC = 10 A dc;
VCE(SAT)1
saturation voltage
pulsed (see 4.5.1)
3071
1.8
V dc
Collector to emitter
IB = 2.5 A dc; IC = 25 A dc;
VCE(SAT)2
saturation voltage
pulsed (see 4.5.1)
3076
Forward-current
40
VCE = 2 V dc; IC = 0.5 A dc;
hFE1
transfer ratio
pulsed (see 4.5.1)
Forward-current
3076
30
120
VCE = 2 V dc; IC = 10 A dc;
hFE2
transfer ratio
pulsed (see 4.5.1)
See footnotes at end of table.
8
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