MIL-PRF-19500/515D
* TABLE I. Group A inspection.
Inspection 1/
MIL-STD-750
Symbol
Limit
Unit
Method
Conditions
Min
Max
Subgroup 1
Visual and mechanical
2071
examination
Subgroup 2
ZθJX
Thermal impedance 2/
3131
See 4.3.3
°C/W
*
Collector to emitter
3011
Bias condition D, IC = 50 mA dc;
V(BR)CEO
breakdown voltage
pulsed (see 4.5.1)
2N6378
100
V dc
2N6379
120
V dc
µA dc
Collector to emitter
ICEO
50
3041
Bias condition D
cutoff current
VCE = 50 V dc
2N6378
VCE = 70 V dc
2N6379
µA dc
Collector to emitter cutoff
3041
Bias condition A; VBE = 1.5 V dc
ICEX1
10
current
2N6378
VCE = 120 V dc
2N6379
VCE = 140 V dc
µA dc
Emitter-base cutoff current
3061
Bias condition D, VEB = 6 V dc
IEBO
100
µA dc
Collector to base cutoff
10
ICBO
3036
Bias condition D,
current
VCB = 120 V dc
2N6378
VCB = 140 V dc
2N6379
50
hFE1
Forward-current transfer ratio
3076
VCE = 4 V dc; IC = 1 A dc;
pulsed (see 4.5.1)
Forward-current transfer ratio
3076
VCE = 4 V dc; IC = 20 A dc;
hFE2
30
120
pulsed (see 4.5.1)
10
hFE3
Forward-current transfer ratio
3076
VCE = 4 V dc; IC = 50 A dc;
pulsed (see 4.5.1)
1.0
V dc
VCE(sat)1
Collector to emitter saturated
3071
IC = 20 A dc; pulsed (see 4.5.1)
voltage
IB = 2.0 A dc
3.0
V dc
VCE(sat)2
3071
IC = 50 A dc; IB = 10 A dc;
Collector to emitter saturated
voltage
pulsed (see 4.5.1)
1.8
V dc
VBE(sat)
Base -emitter saturated
3066
Test condition A; IC = 20 A dc; IB =
voltage
2.0 A dc; pulsed (see 4.5.1)
See footnote at end of table.
8
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