MIL-PRF-19500/516F
* 4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500, and as follows. Electrical measurements (end-points) shall be
performed twice (once in each direction), in accordance with table I, subgroup 2 herein.
Subgroup
Method
Condition
Axial devices - Tension: Condition A, 12 pounds for 1N6102 through 1N6137, t = 15s.
*
C2
2036
Condition A, 20 pounds for 1N6138 through 1N6173. Fatigue: Condition E for all types,
2 pounds. (Lead fatigue is not applicable to US, URS diodes).
*
C2
2036
US, URS devices Tension: Condition A, 12 pounds for 1N6102 through 1N6137.
Condition A, 20 pounds for 1N6138 through 1N6173. Suitable fixtures may be used to pull
the end-caps in a manner which does not aid construction. Reference to axial lead may
be interpreted as end-cap with fixtures used for mounting (see figure 9 herein). (Lead
fatigue is not applicable to US and URS diodes).
C6
1026
See 4.5.1 and 4.5.3.
I(BR) = column 3 of table II, T1 = +25°C ±3°C, T2 = T1 +100°C; sampling plan shall be 45
C7
4071
devices, c = 0; α V(BR) = column 8 of table II.
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-IX of MIL-PRF-19500 and as specified herein. Electrical measurements
(end-points) shall be in accordance with table I, subgroup 2 herein.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Power burn-in and steady-state operation life test conditions. For the purposes of this test, the direction in
which the device is first pulsed shall be considered polarity A and the reverse direction polarity B. The test conditions
and order of events shall be as follows:
a. Pulse in accordance with 4.5.3, in polarity A 5 times (screening and group B) and 50 times (group C) at TA =
+25°C.
b. Pulse in accordance with 4.5.3, in polarity B 5 times (screening and group B) and 50 times (group C) at TA =
+25°C.
c. Read and record IR1 and V(BR)1 in polarities A and B at TA = +25°C, remove defective devices and record
number of failures.
d. Apply the working peak reverse voltage (VRWM) (column 4 of table II) in polarity A at TA = +125°C as follows:
(1) For 48 hours (JANTX and JANTXV) and 120 hours (JANS) for the screening test.
(2) For 170 hours (JAN, JANTX, and JANTXV) for group B steady-state operation life test.
(3) For 500 hours for group C steady-state operation life test.
e. Read IR1 in polarity A at TA = +25°C. Devices with ĆIR1 > 50 percent (100 percent for steady-state
operation life) of the initial reading or 20 percent of column 5 of table II, whichever is greater, shall be
considered defective. Remove defective devices and record the number of failures.
10
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