MIL-PRF-19500/516F
f. Apply the working peak pulse reverse voltage (VRWM) (column 4 of table II) in polarity B at TA = +125°C as
follows:
(1) For 48 hours (JANTX and JANTXV) and 120 hours (JANS) for the screening test.
(2) For 170 hours (JAN, JANTX, and JANTXV) for group B steady-state operation life test.
(3) For 500 hours for group C steady-state operation life test.
g. Readi ID1 in polarity B at TA = +25°C. Devices with ĆID1 > 50 percent (100 percent for steady-state
operation life) of the initial reading or 20 percent of column 5 of table II, whichever is greater, shall be
considered defective. Remove defective devices and record the number of failures.
h. Read V(BR)1 in polarities A and B at TA = +25°C. Devices with ĆVBR1 > ±2 percent (±5 percent for steady-
state operation life) of the initial reading shall be considered defective. Remove defective devices and record
the number of failures.
i. Read ĆID1 in polarity A at TA = +25°C, remove defective devices and record the number of failures.
4.5.1.1 Group C steady-state operation life test (alternate procedure). When the group B 340-hour life test is
continued on test to 1,000 hours to satisfy the group C life test requirements, the test shall be performed as given in
4.5.1 with the following exceptions:
a. In 4.5.1, steps a and b shall be moved and performed following step g.
b. In 4.5.1, steps e and g shall be repeated after steps a and b are performed and before step h is completed
(step i may be omitted when this procedure is used).
4.5.2 Accelerated steady-state operation life. This test shall be conducted with the devices subjected to the
breakdown current specified in column 3 of table II in opposite polarities for 48 +8, -4 hours in each polarity. At the
beginning of the test and at the end of each time period, the devices shall be temperature stabilized at TA = +25°C
and subjected to pulse conditions at the rate of one pulse per minute (max) for ten pulses each, in accordance with
4.5.3 as specified.
4.5.3 Maximum peak pulse current (IP). The peak pulse currents specified in column 7 of table II shall be applied
simultaneously maintaining a bias voltage, not less than the applicable voltage in column 4 of table II, in the same
polarity as the peak pulse current. The peak pulse current shall be applied with a current versus time waveform (1
pulse per minute maximum) such that the pulse current shall reach 100 percent of IP at t ≤ 10 µs and decay to 50
percent of IP at t ≥ 1 ms for tp = 1 ms (see figure 10). NOTE: Tolerance on time (t) shall be +10 -0 percent.
4.5.4 Clamping voltage. The peak pulse clamping voltage shall be measured across the diode in a 1 ms time
interval. The response detector shall demonstrate equipment accuracy of ±3 percent.
11
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business