MIL-PRF-19500/555L
3.6 Electrostatic discharge protection. The devices covered by this specification require electrostatic discharge
protection.
3.6.1 Handling. MOS devices must be handled with certain precautions to avoid damage due to the accumulation
of static charge. However, the following handling practices are recommended (see 3.6).
a.
Devices should be handled on benches with conductive and grounded surface.
b.
Ground test equipment, tools, and personnel handling devices.
c.
Do not handle devices by the leads.
d.
Store devices in conductive foam or carriers.
e.
Avoid use of plastic, rubber, or silk in MOS areas.
f.
Maintain relative humidity above 50 percent, if practical.
g.
Care should be exercised, during test and troubleshooting, to apply not more than maximum rated voltage
to any lead.
Gate must be terminated to source. R ≤ 100 kΩ, whenever bias voltage is to be applied drain to source.
h.
3.7 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance
characteristics are as specified in 1.3, 1.4, and table I.
3.8 Electrical test requirements. The electrical test requirements shall be as specified in table I.
3.9 Workmanship. Semiconductor devices shall be processed in such a manner as to be uniform in quality and
shall be free from other defects that will affect life, serviceability, or appearance.
4. VERIFICATION
4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:
a. Qualification inspection (see 4.2).
b. Screening (see 4.3).
c. Conformance inspection (see 4.4 and tables I and II).
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500. Alternate flow is
allowed for qualification inspection in accordance with MIL-PRF-19500.
4.2.1 JANHC and JANKC devices. Qualification for JANHC and JANKC devices shall be as specified in
MIL-PRF-19500.
4.2.2 Group E qualification. Group E inspection shall be performed for qualification or re-qualification only. In
case qualification was awarded to a prior revision of the specification sheet that did not request the performance of
table II tests, the tests specified in table II herein that were not performed in the prior revision shall be performed by
the first inspection lot of this revision to maintain qualification.
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