MIL-PRF-19500/580C
* TABLE I. Group A inspection - Continued.
Inspection 1/
Symbol
Limits
Unit
Method
Conditions
Min
Max
Subgroup 3 - Continued
TA = -55°C
Low-temperature
operation:
Forward current transfer ratio
3076
15
IC = -250 mA dc VCE = -1.0 V dc;
hFE4
pulsed (see 4.5.1),
Subgroup 4
|hFE |
3306
3
Magnitude of small-signal short-
IC = -100 mA dc, VCE = -10 V dc,
circuit forward-current transfer
f = 1 MHz
ratio
Open circuit output capacitance
3236
Cobo
100
pF
IE = 0, VCB = -10 V dc,
f = 100 KHz
Subgroup 5
TC = +25°C; t ≥ 0.5 s, 1 cycle.
3051
Safe operating area (continuous
dc)
Test 1
IC = -1.0 A dc, VCE = -6 V dc,
Test 2
IC = -500 mA dc, VCE = -12 V dc,
Test 3
2N4234
IC = -166 mA dc, VCE = -30 V dc
2N4235
IC = -100 mA dc, VCE = -50 V dc
2N4236
IC = -71 mA dc, VCE = -70 V dc
End point electricals
See 4.5.4, steps 1 and 2
Subgroups 6 and 7
Not applicable
1/ For sampling plan, see MIL-PRF-19500.
2/ For resubmission of failed subgroup 1 of table I, double the sample size of the failed test or sequence of
tests. A failure in table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall
be rerun upon submission.
3/ Separate samples may be used.
4/ Not required for laser marked devices.
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