MIL-PRF-19500/580C
4.4.3.1 Group C inspection, table VII (JAN, JANTX, and JANTXV) of MIL-PRF-19500.
Subgroup
Method
Condition
C2
2036
Test condition E.
C5
3131
See 4.5.3.
C6
Not applicable.
4.4.3.2 Group C sample selection. Samples for subgroups in group C shall be chosen at random from any
inspection lot containing the intended package type and lead finish procured to the same specification which is
submitted to and passes table I tests for conformance inspection. Testing of a subgroup using a single device type
enclosed in the intended package type shall be considered as complying with the requirements for that subgroup.
4.4.4 Group E Inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table IX of MIL-PRF-19500 and as specified in table II herein. Electrical measurements (end-
points) shall be in accordance with table I, subgroup 2 herein. Delta measurements shall be in accordance with the
applicable steps of 4.5.4.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of
* 4.5.2 Thermal response( ĆVBE measurement). The ĆVBE measurement shall be performed in accordance with
method 3131 of MIL-STD-750. The ĆVBE conditions and maximum VBE limit shall be derived by each vendor. The
chosen ĆVBE measurement and conditions for each device in the qualification lot and read and record measurements
shall be submitted in the qualification report and a thermal response curve shall be plotted. The chosen VBE values
shall be considered final after the manufacturer has had the opportunity to test five consecutive lots. The following
measurements shall apply:
a. Measuring current (IM) .............................................-5 mA.
b. Measurement voltage (VCE ) .....................................-20 V (same as VH).
c. Collector heating current (IH) ...................................-200 mA (minimum for).
d. Collector-emitter heating voltage ..............................-20 V (minimum).
e. Heating time (tH).......................................................10 ms.
f. Measurement time delay (tMD) ................................50 µs.
*
g. Sample window time (tSW) .......................................10 µs maximum.
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