MIL-PRF-19500/627C
3.7 Marking. Devices shall be marked as specified in MIL-PRF-19500.
3.7.1 Marking for US devices. For US version devices only, all marking may be omitted from the device except for
the cathode marking. All marking which is omitted from the body of the device shall appear on the label of the initial
container.
3.8 Polarity. The polarity of all types shall be indicated with a contrasting color band to denote the cathode end.
3.9 Workmanship. Semiconductor devices shall be processed in such a manner as to be uniform in quality and
shall be free from other defects that will affect life, serviceability, or appearance.
4. VERIFICATION
4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:
a. Qualification inspection (see 4.2).
b. Screening (see 4.3).
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as specified
herein.
4.2.1 Group E qualification. Group E inspection shall be performed for qualification or requalification only. In case
qualification was awarded to a prior revision of the specification sheet that did not request the performance of table II
tests, the tests specified in table II herein that were not performed in the prior revision shall be performed by the first
inspection lot to this revision to maintain qualification.
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