MIL-PRF-19500/628C
4.3 Screening (JANS, JANTX, AND JANTXV levels only). Screening shall be in accordance with table E-IV of
MIL-PRF-19500, and as specified herein. The following measurements shall be made in accordance with table I
herein. Devices that exceed the limits of table I herein shall not be acceptable.
Measurement
Screen (see table E-IV
JANS level
JANTXV and JANTX level
(1) 3c
5
Not applicable
Not applicable
9
Not required
Required IR1 and VFM1
10
condition A
IR1 and VFM1, ĆIR1 ≤ 100 percent of initial reading
11
IR1 and VFM1
or �100 nA dc (� 200 nA dc for 1N6625), whichever
is greater. Ć VFM1 ≤ �0.05 V dc
12
Required, see 4.3.2
Required, see 4.3.2
(2) 13
Subgroups 2 and 3 of table I herein:
Subgroup 2 of table I herein:
ĆIR1 ≤ 100 percent of initial reading or �100 nA dc
ĆIR1 ≤ 100 percent of initial reading or
(�200 nA dc for 1N6625), whichever is greater.
�100 nA dc (�200 nA dc for 1N6625),
Ć VFM1 ≤ �0.05 V dc. Scope display evaluation
whichever is greater.
Ć VFM1 ≤ �0.05 V dc. Scope display
(1) Thermal impedance shall be performed any time after sealing provided temperature cycling is performed in
(2) ZθJX is not required in screen 13, if already previously performed.
4.3.1 Thermal impedance. The thermal impedance measurements shall be performed in accordance with
method 3101, as applicable, of MIL-STD-750 using the guidelines in that method for determining IM, IH, tH, and K
4.3.2 Power burn-in conditions. Power burn-in conditions are as follows (see 4.5.3 and 4.5.3.1 herein), TA =
+55�C maximum. Test conditions shall be in accordance with method 1038 of MIL-STD-750, condition B. Adjust IO
to achieve the required TJ. Use method 3100 of MIL-STD-750 to measure TJ. TJ = +115�C minimum and +150�C
maximum.
5
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