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MIL-PRF-19500-628 Semiconductor Device, Diode, Silicon, Ultra-Fast Recovery, Power Rectifier, 1N6690 Through 1N6693, 1N6690Us Through 1N6693Us Jan, Jantx, Jantxv, And JansThis specification covers the performance requirements for a silicon, ultra-fast recovery, semiconductor power rectifier diode. Three levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/628C
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as
specified herein.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500 and table I
herein.
* 4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VIA (JANS) and E-VIB (JAN, JANTX and JANTXV) of MIL-PRF-19500 and 4.4.2.1 and
4.4.2.2 herein. Delta measurements shall be in accordance with table III herein.
* 4.4.2.1 Group B inspection, table E-VIA (JANS) of MIL-PRF-19500. For B5, if a failure occurs, resubmission shall
be at the test conditions of the original sample.
Subgroup
Method
Condition
-0°C to +100°C, 25 cycles.
B3
1056
-55°C to +175°C, 100 cycles.
B3
1051
*
B3
4066
Condition A, IFSM = rated IFSM (see 1.3, col. 4); ten surges of 8.3 ms each at 1
minute intervals, superimposed on IO = 0, VRWM = 0.
IO = IO rated minimum (see 1.3, col. 3); VR = rated VRWM (see col. 2 of 1.3, and
B4
1037
4.5.3); 2,000 cycles.
IO = IO rated minimum (see 1.3, col. 3 and 4.5.3); adjust TA and or IO to achieve
B5
1027
TJ = +150°C minimum. t = 1,000 hours. Temporary leads may be added
for surface mount devices. n = 45, c = 0. Delta shall not exceed 60 percent of
initial reading.
See 4.5.5, +25°C ≤ TA ≤ +35°C (recorded before test is performed); RθJL
B6
4081
(maximum) ≤ 4°C/W; L = .375 inch (9.53 mm). For surface mount devices
(US version), RθJEC = 3.5°C/W maximum.
Peak reverse power, PRM ≥ 318 W for square wave in accordance with method
B8
4065
4065 of MIL-STD-750 (PRM ≥ 500 W for half-sine wave). Test shall be
performed on each sublot; sampling plan n = 10, c = 0, end-points, see 4.4.2.
4.4.2.2 Group B inspection, table E-VIB (JAN, JANTX and JANTXV of MIL-PRF-19500.
Subgroup
Method
Condition
-0°C to +100°C, 10 cycles.
B2
1056
-55°C to +175°C, 25 cycles.
B2
1051
IO = IO (rated, see col. 3 of 1.3) minimum; adjust IO to achieve required TJ of
B3
1027
+125°C minimum; apply VR = rated VRWM (see col. 2 of 1.3), f = 50 - 60 Hz (see
4.5.3.1). Delta shall not exceed 25 percent of initial reading.
6



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