MIL-PRF-19500/115N
4.5.3 Temperature coefficient of regulator voltage (Vz). The device shall be temperature stabilized with current
applied prior to reading regulator voltage at the specified ambient temperature as specified in 4.4.3, subgroup C8.
4.5.4 Voltage regulation Vz(reg). Voltage regulation shall be determined by the difference of the regulator voltage
measured at different currents as specified in table I, subgroup 7. Both tests shall be performed at thermal
equilibrium. This Vz shall not exceed column 9 of table III.
4.5.5 Free air burn-in and life tests. The use of a current limiting or ballast resistor is permitted provided that each
DUT still sees the IZ(min) described in 4.3.3 and that the minimum applied voltage, where applicable, is maintained
through-out the burn-in period. Use method 3100 of MIL-STD-750 to measure TJ.
4.5.6 For initial qualifications and requalifications. Read and record data in accordance with table II herein and
shall be included in the qualification report.
4.5.7 Thermal resistance. Thermal resistance measurement shall be in accordance with method 4081 of
MIL-STD-750 using the guidelines in that method for determining IM, IH, and tH. Measurement delay time tMD =
70 s maximum. See MIL-PRF-19500, table E-IX, subgroup 4. Forced moving air or draft shall not be permitted
across the device during test.
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