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MIL-PRF-19500-115 Semiconductor Device, Diode, Silicon, Voltage Regulator, Types 1N3821A Through 1N3828A, 1N3016B Through 1N3051B, 1N3821A┬Û1 Through 1N3828A┬Û1, 1N3016B┬Û1 Through 1N3051B┬Û1, 1N3821Aur┬Û1 Through 1N3828Aur┬Û1, 1N3016Bur┬Û1 Through 1N3051Bur┬Û1, Plus C┬Û And D┬Û Tolerance Suffix, Jan, Jantx, Jantxv, And JanhcThis specification covers the performance requirements for 1 W, silicon, voltage regulator diodes with voltage tolerances of 5 percent, 2 percent, and 1 percent. Three levels of product assurance are provided for each device type as specified in MIL┬ûPRF┬û19500. One level of product assurance is provided for die.

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MIL-PRF-19500/115N

* TABLE I. Group A inspection.

MIL-STD-750

Limits 2/

Symbol

Inspection 1/

Unit

Method

Conditions

Min

Max

Subgroup 1

2071

Visual and mechanical

examination

Subgroup 2

Forward voltage

4011

IF =200 mA dc

1.2

V dc

A dc

IR1

Col. 12

Reverse current

4016

DC method; VR = column 11

of table III.

Col. 3

Col. 4

V dc

Regulator voltage

4022

IZ1 = IZ = (column 5 of table

(see 4.5.2)

III).

C/W

ZJX

Thermal impedance

3101

See 4.3.2

(-1 device only).

Subgroup 3

TA = +150C

High-temperature operation

A dc

4016

DC method: VR = column 11

IR2

Reverse current

Col. 14

(-1 device only)

of table III.

Subgroup 4

4051

IZ = (column 5 of table III).

ZZT

Small-signal reverse

Col. 6

ohms

breakdown impedance

Isig =10 percent of IZ.

ZZK

Col. 7

ohms

Small-signal knee

4051

IZK = (column 17 of table III).

impedance

Isig =10 percent of IZK.

Subgroups 5 and 6

Not applicable

Subgroup 7

VZ(reg)

Col. 9

V dc

Voltage regulation

IZ = 10 percent of column 8

(see 4.5.4)

of table III (current 1).

IZ = 50 percent of column 8

of table III (current 2).

1/ For sampling plan, see MIL-PRF-19500.

2/ Column references are to table III herein.