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MIL-PRF-19500-228 Semiconductor Device, Diode, Silicon, Rectifier, Types 1N3611, 1N3612, 1N3613, 1N3614, 1N3957, Jan And JantxThis specification covers the performance requirements for 1.0 ampere silicon rectifier diodes. Two levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/228R
* 4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-VIB (JAN and JANTX) of MIL-PRF-19500, and as follows. Electrical
measurements (end-points) shall be in accordance with the applicable steps of table I, subgroup 2 herein. Delta
requirements shall be in accordance with the applicable steps of table III herein.
4.4.2.1 Group B inspection, appendix E, table E-VIB of MIL-PRF-19500.
Subgroup
Method
Conditions
IFSM = 30 A(pk), 10 surges of 8.3 ms each at 1 minute intervals, IO = 1 A dc,
B2
4066
VRWM = rated (see 1.3), TA = +55°C. n = 22, c = 0.
TA = +55°C (max), IO = 1A, VR = rated VRWM (see 1.3), t = 340 hours,
*
B3
1027
f = 60 Hz. Adjust IO to achieve a TJ = +150°C minimum.
TA = +175°C, t = 340 hours.
B6
1032
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-VII of MIL-PRF-19500 and as follows. Electrical measurements (end-points)
shall be in accordance with the applicable steps of table I, subgroup 2 herein. Delta requirements shall be in
accordance with the applicable steps of table III herein.
4.4.3.1 Group C inspection appendix E, table E-VII of MIL-PRF-19500.
Subgroup
Method
Conditions
C2
2036
Tension: Test condition A, weight = 12 pounds, t = 15 s. Lead fatigue: Test
condition E, weight = 2 pounds.
+25°C ≤ TL ≤ +35°C (recorded before test is performed),
C5
4081
RθJL ≤ maximum rated RθJL (see 1.3 and 4.5.4).
TA = +55°C (max), IO = 1A, VRWM = rated VRWM (see 1.3),
C6
1026
f = 60 Hz. t = 1,000 hrs Adjust IO to achieve a TJ = +150°C minimum.
C8
2031
n = 22, c = 0, one cycle.
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-IX of MIL-PRF-19500 and table II herein. Electrical measurements (end-
points) shall be in accordance with the applicable inspections of table I, subgroup 2 herein. See table III herein for
delta limits when applicable.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Burn-in and life tests The use of a current limiting or ballast resistor is permitted provided that each DUT still
sees the required TJ and full rated Io and that the minimum required voltage VRWM is maintained throughout the burn-
in period. Use method 3100 of MIL-STD-750 to measure TJ.
4.5.2 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.
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