MIL-PRF-19500-228 Semiconductor Device, Diode, Silicon, Rectifier, Types 1N3611, 1N3612, 1N3613, 1N3614, 1N3957, Jan And JantxThis specification covers the performance requirements for 1.0 ampere silicon rectifier diodes. Two levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/228R

4.5.3 Scope display evaluation. Scope display evaluation shall be sharp and stable in accordance with method

4023 of MIL-STD-750. Scope display may be performed on ATE (automatic test equipment) for screening only, with

the approval of the qualifying activity. Scope display in table I, subgroup 4 shall be performed on a curve tracer. The

reverse current (IBR) over the knee shall be 500 �A peak.

4.5.4 Thermal resistance. Thermal resistance measurement shall be performed in accordance with method 4081

of MIL-STD-750 using the guidelines in that method for determining IM, IH, and tH. Measurement delay time tMD =

70 �s max. Forced moving air or draft shall not be permitted across the devices during test.