MIL-PRF-19500/251R
TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Limit
Unit
Symbol
Method
Conditions
Min
Max
Subgroup 4
hfe
Magnitude of common emitter
3306
2.5
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VCE = 20 V dc; IC = 20 mA dc;
small-signal short- circuit
f = 100 MHz
forward current transfer ratio
Small-signal short-circuit
3206
VCE = 10 V dc; IC = 1 mA dc;
hfe
forward current transfer ratio
f = 1 kHz
2N2218
25
2N2219
50
2N2218A, 2N2218AL
35
2N2219A, 2N2219AL
75
Open circuit output
3236
8
pF
VCB = 10 V dc; IE = 0;
Cobo
capacitance
100 kHz ≤ f ≤ 1 MHz
Open circuit output
3240
25
pF
VEB = 0.5 V dc; IC = 0;
Cibo
capacitance
100 kHz ≤ f ≤ 1 MHz
Saturated turn-on time
(See figure 6)
ton
ns
40
2N2218, 2N2219
ns
35
2N2218A, 2N2219A
ns
35
2N2218AL, 2N2219AL
Saturated turn-off time
(See figure 7)
toff
250
2N2218, 2N2219
ns
300
2N2218A, 2N2219A
ns
2N2218AL, 2N2219AL
300
ns
Subgroups 5 and 6
Not applicable
1/ For sampling plan see MIL-PRF-19500.
2/ For resubmission of failed test in subgroup 1 of table I, double the sample size of the failed test or sequence
of tests. A failure in table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test
shall be rerun upon submission.
3/ Separate samples may be used.
4/ Not required for JANS devices.
5/ Not required for laser marked devices.
6/ This hermetic seal test is an end-point to temp-cycling in addition to electrical measurements.
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