MIL-PRF-19500/251R
JANTXV) herein for group C testing. Electrical measurements (end-points) shall be in accordance with table I,
subgroup 2. and 4.5.2 herein.
4.4.3.1 Group C inspection (JANS), table E-VII of MIL-PRF-19500.
Method
Condition
Subgroup
C2
2036
Test condition E.
RθJA and RθJC only, as applicable (see 1.3) and in accordance with thermal
C5
3131
impedance curves.
1,000 hours at VCB = 10 V dc; power shall be applied to achieve TJ = +150°C minimum
C6
1026
and a minimum of PD = 75 percent of maximum rated PT as defined in 1.3 n = 45, c = 0.
The sample size may be increased and the test time decreased as long as the devices are
stressed for a total of 45,000 device hours minimum, and the actual time of test is at least
340 hours.
4.4.3.2 Group C inspection (JAN, JANTX, and JANTXV), table E-VII of MIL-PRF-19500.
Subgroup
Method
Condition
C2
2036
Test condition E.
RθJA and RθJC only, as applicable (see 1.3) and in accordance with thermal impedance
C5
3131
curves.
C6
Not applicable.
4.4.3.3 Group C sample selection. Samples for subgroups in group C shall be chosen at random from any
inspection lot containing the intended package type and lead finish procured to the same specification which is
submitted to and passes table I tests herein for conformance inspection. When the final lead finish is solder or any
plating prone to oxidation at high temperature, the samples for C6 life test may be pulled prior to the application of
final lead finish. Testing of a subgroup using a single device type enclosed in the intended package type shall be
considered as complying with the requirements for that subgroup.
4.4.4 Group D inspection. Conformance inspection for hardness assured JANS and JANTXV types shall include
the group D tests specified in table II herein. These tests shall be performed as required in accordance with
MIL-PRF-19500 and method 1019 of MIL-STD-750, for total ionizing dose or method 1017 of MIL-STD-750 for
neutron fluence as applicable (see 6.2 herein), except group D, subgroup 2 may be performed separate from other
subgroups. Group D inspection may also be performed ahead of the screening lot using die selected in accordance
with MIL-PRF-19500 and related documents. Alternate package options may also be substituted for the testing
provided there is no adverse effect to the fluence profile.
4.4.5 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-IX of MIL-PRF-19500 and as specified in table III herein. Electrical measurements (end-
points) shall be in accordance with table I, subgroup 2 herein.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.
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