MIL-PRF-19500/251R
4.3 Screening. Screening shall be in accordance with table E-IV of MIL-PRF-19500 and as specified herein. The
following measurements shall be made in accordance with table I herein. Devices that exceed the limits of table I
herein shall not be acceptable.
Screen (see table E-IV
Measurement
of MIL-PRF-19500)
JANS level
JANTX and JANTXV levels
(1) 3c
Thermal impedance (see 4.3.2)
Thermal impedance (see 4.3.2)
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ICBO2, hFE4
Not applicable
10
48 hours minimum
48 hours minimum
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ICBO2; hFE4;
ICBO2, hFE4
ĆICBO2 = 100 percent of initial value or 5 nA
dc, whichever is greater.
ĆhFE4 = ±15 percent
12
See 4.3.1
See 4.3.1
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Subgroups 2 and 3 of table I herein;
Subgroup 2 of table I herein;
ĆICBO2 = 100 percent of initial value or 5 nA
ĆICBO2 = 100 percent
dc, whichever is greater;
of initial value or 5 nA dc, whichever is
ĆhFE4 = ±15 percent
greater; ĆhFE4 = ±15 percent
(1) Shall be performed anytime after temperature cycling, screen 3a; and does not need to be repeated in
screening requirements.
4.3.1 Power burn-in conditions. Power burn-in conditions are as follows: VCB = 10 - 30 V dc. Power shall be
applied to achieve TJ = +135°C minimum using a minimum PD = 75 percent of PT maximum rated as defined in 1.3.
TA = 25°C ±10°C. With approval of the qualifying activity and preparing activity, alternate burn-in criteria (hours, bias
conditions, TJ, and mounting conditions) may be used for JANTX and JANTXV quality levels. A justification
demonstrating equivalence is required. In addition, the manufacturing site's burn-in data and performance history will
be essential criteria for burn-in modification approval. Use method 3100 of MIL-STD-750 to measure TJ.
4.3.2 Thermal impedance. The thermal impedance shall be performed in accordance with method 3131 of
MIL-STD-750 using the guidelines in that method for determining IM, IH, tH, (and VC where appropriate).
Measurement delay time (tMD) = 70 µs max. See table III, group E, subgroup 4 herein.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500, and as
specified herein. If alternate screening is being performed in accordance with MIL-PRF-19500, a sample of screened
devices shall be submitted to and pass the requirements of table I, group A1 and A2 inspection only (table E-VIb,
group B, subgroup 1 is not required to be performed again if group B has already been satisfied in accordance with
4.4.2 herein).
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500, and table I
herein.
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