MIL-PRF-19500/251R
TABLE I. Group A inspection.
Inspection 1/
MIL-STD-750
Limit
Unit
Symbol
Method
Conditions
Min
Max
Subgroup 1 2/
Visual and mechanical
2071
n = 45 devices, c = 0
examination 3/
Solderability 3/ 4/
2026
n = 15 leads, c = 0
Resistance to solvents
1022
n = 15 devices, c = 0
3/ 4/ 5/
Temp cycling 3/ 4/
1051
Test condition C, 25 cycles.
n = 22 devices, c = 0
Hermetic seal 4/ 6/
1071
n = 22 devices, c = 0
Fine leak
Gross leak
Electrical measurements 4/
Table I, subgroup 2
Bond strength 3/ 4/
2037
Precondition
TA = +250°C at t = 24 hours or
TA = +300°C at t = 2 hours
n = 11 wires, c = 0
Decap internal visual (design
2075
n = 4 devices, c = 0
verification) 4/
Subgroup 2
°C/W
Thermal impedance
3131
See 4.3.2
ZθJX
Collector to base cutoff current
3036
Condition D
ICBO1
µA dc
2N2218, 2N2219
10
VCB = 60 V dc
µA dc
2N2218A, 2N2219A
10
VCB = 75 V dc
µA dc
10
2N2218AL, 2N2219AL
VCB = 75 V dc
Emitter to base cutoff current
3061
IEBO1
µA dc
2N2218, 2N2219
10
VEB = 5 V dc
µA dc
2N2218A, 2N2219A
10
VEB = 6 V dc
µA dc
2N2218AL, 2N2219AL
10
VEB = 6 V dc
Breakdown voltage, collector to
3011
Bias condition D; IE = 10 mA dc;
V(BR)CEO
emitter
pulsed (see 4.5.1).
2N2218, 2N2219
30
V dc
2N2218A, 2N2219A
50
V dc
2N2218AL, 2N2219AL
50
V dc
See footnotes at end of table.
9
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business