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MIL-PRF-19500-304 Semiconductor Device, Diode, Silicon, Power Rectifier, Fast-Recovery Types 1N3885, 1N3886, 1N3888, 1N3890, 1N3891, 1N3893, 1N3890R, 1N3891R, 1N3893R And A-Versions Jan, Jantx, Jantxv, Jans, Janhc And JankcThis specification covers the performance requirements for 12 and 20 ampere, silicon fast recovery, power, rectifier diodes. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500, and two levels of product assurance for each unencapsulated device type.

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. . . . . . . .
MIL-PRF-19500/304E
* 4.4.2.2 Group B inspection, table E-VIb (JAN, JANTX and JANTXV) of MIL-PRF-19500.
Subgroup
Method
Condition
Insulated types -55°C to + 175°C; uninsulated types -55°C to + 175°C.
B2
1051
TC = 100°C; VR = rated VR (see 1.3), six surges. one surge per minute maximum.
B2
4066
tp = 8.3 ms. Non-A version devises, IFS = 150 A; IO = 12 A dc A version devises,
IFS = 225 A; IO = 20 A dc.
*
B3
1037
0.25 rated IO < IO applied < rated IO (see 4.5.4) 2,000 cycles. For irradiated
devices, include trr as an end-point measurement.
*
B3
1038
Condition A; 340 hrs (separate samples may be used). For irradiated devices,
include trr as an end-point measurement.
or
1049
B5
Not applicable.
TA = 150°C.
B6
1032
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-VII of MIL-PRF-19500 and as follows. Electrical measurements (end-points)
shall be in accordance with table I, subgroup 2 herein. Delta measurements shall be in accordance with table III
herein.
4.4.3.1 Group C inspection, table E-VII of MIL-PRF-19500.
Subgroup
Method
Condition
C2
1056
Test condition B.
C2
2036
Tension, test condition A, t = 15 s.
For 1N3885, A, 1N3886, A, 1N3888, A weight = 5 pounds.
For 1N3890, A, R, AR, 1N3891, A, R, AR, 1N3893, A, R, AR, weight = 20
pounds.
C2
2036
Bending stress, test condition F, method B: t = 15 s.
For 1N3885, A, 1N3886, A, 1N3888, A weight = 1 pounds.
For 1N3890, A, R, AR, 1N3891, A, R, AR, 1N3893, A, R, AR, weight = 5 pounds.
C2
2036
Seal torque test condition D1, torque = 10 oz-inches, t = 15 s.
RθJC = rated RθJC (see 1.4); IM = 50 mA ≤ IM ≤ 250 mA; tH = 30 s minimum; tMD
C5
3101
= 50 to 300 µs.
*
C6
1037
0.25 rated IO < IO applied < rated IO (see 4.5.4) 6,000 cycles. For irradiated
devices, include trr as an end-point measurement.
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-IX of MIL-PRF-19500, and table II herein. Electrical measurements (end-
points) shall be in accordance with table, subgroup 2 herein. Delta electrical measurements shall be in accordance
with table III herein.
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