MIL-PRF-19500/308D
* 3.8 Workmanship. Semiconductor devices shall be processed in such a manner as to be uniform in quality and
shall be free from other defects that will affect life, serviceability, or appearance.
4. VERIFICATION
4.1 Classification of Inspections. The inspection requirements specified herein are classified as follows:
a. Qualification inspection (see 4.2).
b. Screening (see 4.3)
c. Conformance inspection (see 4.4).
4.1.1 Sampling and inspection. Sampling and inspection shall be in accordance with MIL-PRF-19500 and herein,
except lot accumulation period shall be 3 months in lieu of 6 weeks.
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500.
* 4.2.1 Group E qualification. Group E inspection shall be performed for qualification or re-qualification only. In
case qualification was awarded to a prior revision of the specification sheet that did not require the performance of
table II tests, the tests specified in table II herein that were not performed in the prior revision shall be performed on
the first inspection lot of this revision to maintain qualification.
4.3 Screening. Screening shall be in accordance with table E-IV of MIL-PRF-19500, and as specified herein. The
following measurements shall be made in accordance with table I herein. Devices that exceed the limits of table I
herein shall not be acceptable.
Screen (see table E-
JANTX and JANTXV levels
IV of MIL-PRF-
19500)
1/
Surge, see 4.3.1
Thermal response, see 4.3.2
4
Not applicable
9
VF2 and IR1 2/
10
MIL-STD-750, method 1038, test condition A,
*
t = 48 hours, TA = +150°C (min)
11 3/
Subgroup 2 of table I herein
VF2 and IR1; ĆVF2 = ±0.1 v(pk);
ĆIR1 = ±5 µA dc or 100 percent from the initial
value, whichever is greater.
12
Not applicable
13
Not applicable
1/ Surge shall precede thermal response. These tests shall be performed anytime after screen 3
and before screen 9.
2/ IR1 measurement shall not be indicative of an open condition.
3/ PDA of screen 13 shall apply to screen 11.
4.3.1 Surge current. Surge current, see MIL-STD-750, method 4066. IO = 0; VRM(w) = 0; Non-A version, IF(surge)
= 400 A; A version, IF(surge) = 500 A; six surges; TA = 25°C; tp = 8.3 ms
4
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