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MIL-PRF-19500-308 Semiconductor Device, Diode, Silicon, Power Rectifier, Fast-Recovery Types 1N3909, 1N3910, 1N3911, 1N3912, 1N3913, R And A Versions Jan, Jantx, And JantxvThis specification covers the performance requirements for silicon, semiconductor fast recovery, power rectifier diodes. Three levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/308D
4.3.2 Thermal response. The thermal response measurements shall be performed in accordance with
method 3101 of MIL-STD-750. The thermal response conditions and maximum thermal response limit shall be
derived by each vendor. The chosen thermal response measurement and conditions for each device in the
qualification lot shall be submitted in the qualification report and a thermal response curve shall be plotted. The
chosen thermal response values shall be considered final after the manufacturer has had the opportunity to test
five consecutive lots. Heating current (IH) ≥ rated IO; tH = 150 to 400 ms; tMD = 50 to 300 µs; 50 mA ≤ IM ≤ 250
mA.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500, and as
specified herein.
* 4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500, and table I
herein. Electrical measurements (end-points) shall be in accordance with subgroup 2 of table I herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VIb (JAN, JANTX, and JANTXV) of MIL-PRF-19500 and 4.4.2.1 herein. Electrical
measurements (end-points) shall be in accordance with subgroup 2 of table I herein. Delta measurements shall be in
accordance with table III herein.
4.4.2.1 Group B inspection, table E-VIb (JAN, JANTX and JANTXV) of MIL-PRF-19500.
Subgroup
Method
Condition
Non-A version devices: TC = 100°C; VR = Rated VRM (see 1.3), six
B2
4066
surges. 1 surge per minute maximum. tp = 8.3 ms. if (surge) = 300 A; IO =
30 A dc
A version devices: TC = 100°C; VR = Rated VRM (see 1.3), six surges. 1
B2
4066
surge per minute maximum. tp = 8.3 ms. if (surge) = 400 A; IO = 50 A dc
0.25 Rated IO < IO applied < Rated IO (see 4.5.1) 2,000 cycles, TA ≤ 35°C.
*
B3
1037
For irradiated devices, include trr as an end-point measurement.
B3
1038
Condition A; 340 hrs.
or
1049
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500 and 4.4.3.1 herein. Electrical measurements (end-points) shall be
in accordance with subgroup 2 of table I herein. Delta measurements shall be in accordance with table III herein.
4.4.3.1 Group C inspection, table E-VII of MIL-PRF-19500.
Subgroup
Method
Condition
C2
2036
Test condition F, method B, Weight = 15 pounds, t = 15s.
C2
2036
Test condition D1, seal torque = 3 pound-inches, t = 15s.
C2
2036
Test condition D2, stud torque = 30 pound-inches, t = 15s.
0.25 Rated IO < IO applied < Rated IO (see 4.5.1) 6,000 cycles. TA ≤ 35°C.
*
C6
1037
For irradiated devices, include trr as an end-point measurement.
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-IX of MIL-PRF-19500. Electrical measurements (end-points) shall be in accordance with
subgroup 2 of table I herein. Delta measurements shall be in accordance with table III herein.
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