MIL-PRF-19500/348F
* TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Unit
Symbol
Limit
Method
Conditions
Min
Max
Subgroup 4
Extrapolated unity
3261
VCE = 10 V dc;
ft
gain frequency
IC = 50 mA dc; f = 100 MHz
2N3467, L
175
500
MHz
2N3468, L
150
500
MHz
Open circuit output
3236
VCB = 10 V dc;
Cobo
25
pF
capacitance
IE = 0; 100 kHz ≤ f ≤ 1 MHz
Input capacitance
3240
Cibo
100
pF
VEB = 0.5 V dc; IC = 0;
(output open-
100 kHz ≤ f ≤ 1 MHz (see 4.5.2)
circuited)
Pulse response
Delay time
3251
Test condition A; IC = 500 mA dc;
td
10
ns
IB1 = 50 mA dc; VEB = 2 V dc
(see figure 6)
Rise time
3251
Test condition A; IC = 500 mA dc;
tr
30
ns
IB1 = 50 mA dc; VEB = 2 V dc
(see figure 6)
Storage time
3251
Test condition A; IC = 500 mA dc;
ts
60
ns
IB1 = IB2 = 50 mA dc;
(see figure 7)
Fall time
3251
Test condition A; IC = 500 mA dc;
tf
30
ns
IB1 = IB2 = 50 mA dc;
(see figure 7)
Subgroups 5, 6, and 7
Not applicable
1/ For sampling plan see MIL-PRF-19500.
2/ For resubmission of failed subgroup of table I, double the sample size of the failed test or sequence of tests. A
failure in table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun
upon submission.
3/ Separate samples may be used.
4/ Not required for JANS devices.
5/ Not required for laser marked devices.
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