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MIL-PRF-19500-349 Semiconductor Device, Transistor, Npn, Silicon, Switching, Types 2N3506, 2N3506A, 2N3506L, 2N3506Al, 2N3506U4, 2N3506Au4, 2N3507, 2N3507L, 2N3507A, 2N3507Al, 2N3507U4, And 2N3507Au4, Jan, Jantx, Jantxv, Jans, Jansm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, Jansh, Janhca, Jankca, Jankcam, Jankcad, Jankcap, Jankcal, Jankcar, Jankcaf, Jankcag, And JankcahThis specification covers the performance requirements for NPN, silicon, switching transistors. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Two levels of product assurance are provided for each unencapsulated device type. Provisions for radiation hardness assurance \(RHA\) to eight radiation levels is provided for JANTXV, JANS, JANHC, and JANKC product assurance levels. RHA level designators "M", "D", "P", "L", "R", "F", "G", and "H" are appended to the device prefix to identify devices, which have passed RHA requirements.

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MIL-PRF-19500/349J
TABLE I. Group A inspection - Continued.
Inspection 1/ 2/
MIL-STD-750
Limit
Unit
Symbol
Method
Conditions
Min
Max
Subgroup 4
Small-signal short- circuit
3206
3
15
VCE = 5 V dc, IC = 100 mA dc, f = 20 MHz
|hfe|
forward-current transfer ratio
Open circuit output
3236
40
pF
VCB = 10 V dc, IE = 0,
Cobo
capacitance
100 kHz ≤ f ≤ 1 MHz
Input capacitance (output
3240
300
pF
VEB = 3 V dc, IC = 0,
Cibo
open-circuited)
100 kHz ≤ f ≤ 1 MHz
Pulse response:
Delay time
3251
15
ns
Test condition A, IC = 1.5 A dc,
td
IB1 = 150 mA dc, (see figure 10)
Rise time
3251
30
ns
Test condition A, IC = 1.5 A dc,
tr
IB1 = 150 mA dc, (see figure 10)
Storage time
3251
55
ns
Test condition A, IC = 1.5 A dc,
tS
IB1 = IB2 = 150 mA dc, (see figure 11)
Fall time
3251
35
ns
Test condition A, IC = 1.5 A dc,
tf
IB1 = IB2 = 150 mA dc, (see figure 11)
1/
For sampling plan see MIL-PRF-19500.
2/
Electrical characteristics for "A", "AL", "U4", "AU4" and "L" suffix devices are identical to non-suffix devices
unless otherwise noted.
3/
For resubmission of failed subgroup 1, double the sample size of the failed test or sequence of tests. A
failure in table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun
upon submission.
4/
Separate samples may be used.
5/
Not required for JANS devices.
6/
Not required for laser marked devices.
7/
This test is required for the following end-point measurements only.
JANS - group B, subgroup 3 and 4. JANTX and JANTXV ­ group B, step 1 group C, subgroup 2; group E,
subgroup 1 and 2.
13



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