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MIL-PRF-19500-349 Semiconductor Device, Transistor, Npn, Silicon, Switching, Types 2N3506, 2N3506A, 2N3506L, 2N3506Al, 2N3506U4, 2N3506Au4, 2N3507, 2N3507L, 2N3507A, 2N3507Al, 2N3507U4, And 2N3507Au4, Jan, Jantx, Jantxv, Jans, Jansm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, Jansh, Janhca, Jankca, Jankcam, Jankcad, Jankcap, Jankcal, Jankcar, Jankcaf, Jankcag, And JankcahThis specification covers the performance requirements for NPN, silicon, switching transistors. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Two levels of product assurance are provided for each unencapsulated device type. Provisions for radiation hardness assurance \(RHA\) to eight radiation levels is provided for JANTXV, JANS, JANHC, and JANKC product assurance levels. RHA level designators "M", "D", "P", "L", "R", "F", "G", and "H" are appended to the device prefix to identify devices, which have passed RHA requirements.

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MIL-PRF-19500/349J

1.4 Primary electrical characteristics. (1)

hFE2 (1)

hFE4 (1)

VCE(sat)

|hfe|

Cobo

ton

toff

Limits

f = 20 Mhz

VCB = 10 V dc

IC = 1.5 A dc

VCE = 2.0 V dc

VCE = 5.0 V dc

IC = 1.5 A dc

VCE = 5 V dc

IE = 0

IC = 1.5 A dc

IC = 3.0 A dc

IB = 150 mA dc

IB = 150 mA

100 kHz ≤ f

2N3506,

2N3507,

2N3506,

2N3507,

IC = 100 mA

≤ 1 MHz

2N3506A,

2N3507A,

2N3506A,

2N3507A,

2N3506L,

2N3507L,

2N3506L,

2N3507L,

2N3506AL,

2N3507AL,

2N3506AL,

2N3507AL,

2N3506U4

2N3507U4

2N3506U4

2N3507U4

2N3506AU4

2N3507AU4

2N3506AU4

2N3507AU4

V dc

Min

Max

200

150

1.0

(1) Pulsed (see 4.5.1).

2. APPLICABLE DOCUMENTS

2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This

section does not include documents cited in other sections of this specification or recommended for additional

information or as examples. While every effort has been made to ensure the completeness of this list, document

users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this

specification, whether or not they are listed.

2.2 Government documents.

2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a

part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are

those cited in the solicitation or contract.

DEPARTMENT OF DEFENSE SPECIFICATIONS

MIL-PRF-19500

Semiconductor Devices, General Specification for.

DEPARTMENT OF DEFENSE STANDARDS

MIL-STD-750

Test Methods for Semiconductor Devices.

* (Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch or

https://assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D,

Philadelphia, PA 19111-5094.)

* 2.3 Order of precedence. Unless otherwise noted herein or in the contract, in the event of a conflict between the

text of this document and the references cited herein, the text of this document takes precedence. Nothing in this

document, however, supersedes laws and regulations unless a specific exemption has been obtained.