MIL-PRF-19500/349J
* TABLE II. Group D inspection - Continued.
Inspection 1/ 2/ 3/
MIL-STD-750
Limit
Unit
Symbol
Method
Conditions
Min
Max
Subgroup 1 - Continued.
Collector to emitter saturation
3071
1.73
V dc
IC = 2.5 A dc, IB = 250 mA dc,
VCE(sat)3
*
voltage
pulsed (see 4.5.1)
Base to emitter saturated
3066
1.15
V dc
Test condition A, IC = 500 mA dc,
VBE(sat)1
voltage
Base to emitter saturated
3066
0.8
1.5
V dc
Test condition A, IC = 1.5 A dc,
VBE(sat)2
voltage
Base to emitter saturated
3066
2.3
V dc
Test condition A, IC = 2.5 A dc,
VBE(sat)3
voltage
Subgroup 2
1019
Gamma exposure
Total dose irradiation
2N3506
VCES = 32 V
2N3507
VCES = 40 V
Bias condition D, IC = 100 µA dc
Breakdown voltage collector to
3001
V(BR)CBO
base
2N3506
60
V dc
2N3507
80
V dc
Bias condition D, IE = 10 µA dc
Breakdown voltage emitter to
3026
5
V dc
V(BR)EBO
base
Breakdown voltage collector to
3011
Bias condition D, IC = 10 mA dc,
V(BR)CEO
emitter
pulsed (see 4.5.1)
2N3506
40
V dc
2N3507
50
V dc
µA dc
Collector to emitter cutoff
3041
2
Bias condition A, VEB = 4 V dc
ICEX1
current
2N3506
VCE = 40 V dc
2N3507
VCE = 60 V dc
Forward-current transfer ratio
3076
[hFE1] 5/
VCE = 1 V dc, IC = 500 mA dc,
pulsed (see 4.5.1)
2N3506
[25]
250
2N3507
[17.5]
175
Forward-current transfer ratio
3076
VCE = 2 V dc, IC = 1.5 A dc, pulsed
[hFE2] 5/
(see 4.5.1)
2N3506
[20]
200
2N3507
[15]
150
See footnotes at end of table.
15
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