MIL-PRF-19500/384H
4.3 Screening (JANTX and JANTXV levels only). Screening shall be in accordance with table E-IV of
MIL-PRF-19500,and as specified herein. The following measurements shall be made in accordance with table I
herein. Devices that exceed the limits of table I herein shall not be acceptable.
Screen (see table E-IV
Measurement
of MIL-PRF-19500)
JANTX and JANTXV levels
Thermal impedance (see 4.3.2)
(1) 3c
9
ICEX1
11
hFE2, ICEX1;
ĆICEX1 = ± 100 percent of initial value or ±0.1 mA dc,
whichever is greater
12
See 4.3.1
13
Subgroup 2 of table I herein;
ĆICEX1 = ±100 percent of initial value or ±0.1 mA dc,.
ĆhFE2 = ±20 percent of initial value.
(1) Shall be performed anytime after temperature cycling, screen 3a; and does not need to be repeated
in screening requirements.
4.3.1 Power burn-in. Power burn-in conditions are as follows: PT = 2.5 W, VCB = 150 V dc, TA = +25°C, minimum
NOTE: No heat sink or forced air cooling on the devices shall be permitted.
4.3.2 Thermal impedance. The thermal impedance measurements shall be performed in accordance with method
3131 of MIL-STD-750 using the guidelines in that method for determining IM, IH, tH, tSW, (and VH where appropriate).
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500, and table I
herein.
* 4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-VIB (JAN, JANTX, and JANTXV) of MIL-PRF-19500, and as follows. Delta
measurements shall be in accordance with table II herein.
Subgroup
Method
Conditions
ĆTJ = +100°C, test condition D. The heating cycle shall be 1 minute minimum.
*
B3
1037
5
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