MIL-PRF-19500-391 Semiconductor Device, Transistor, Npn, Silicon, Low-Power Types 2N3019, 2N3019S, 2N3057A, 2N3700, And 2N3700Ub, Jan, Jantx, Jantxv, Jantxvm, Jantxvd, Jantxvp, Jantxvl, Jantxvr, Jantxvf, Jantxvg, Jantxvh Jans, Jansm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, Jansh, Janhca, Janhcb, Jankca, Jankcb Jankcbm, Jankcd, Jankcp, Jankcl, Jankcr, Jankcf, Jankcg, And JankchThis specification covers the performance requirements for NPN, silicon, low-power transistors. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Two levels of product assurance are provided for the unencapsulated device type 2N3700. Provisions for radiation hardness assurance \(RHA\) to three radiation levels is provided for JANTXV JANS, JANHC, and JANKC product assurance levels. Radiation hardness assurance \(RHA\) level designators "M", "D", "P", "L", "R", "F", "G" and "H" are appended to the device prefix to identify devices, which have passed RHA requirements.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14 - 15

MIL-PRF-19500/391N

4.4.2.3 Group B sample selection. Samples selected from group B inspection shall meet all of the following

requirements:

For JAN, JANTX and JANTXV samples shall be selected randomly from a minimum of three wafers (or from

each wafer in the lot) from each wafer lot. For JANS, samples shall be selected from each inspection lot.

See MIL-PRF-19500.

Shall be chosen from an inspection lot that has been submitted to and passed table I, group A, subgroup 2

conformance inspection. When the final lead finish is solder or any plating prone to oxidation at high

temperature, the samples for life test (table E-VIa, subgroups B4 and B5 for JANS, and table E-VIc, group B

for JAN, JANTX and JANTXV) may be pulled prior to the application of final lead finish.

4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the tests and conditions

specified for subgroup testing in table E-VII of MIL�PRF�19500, and in 4.4.3.1 herein (JANS). See 4.4.3.2 herein for

JAN, JANTX, and JANTXV group C testing. Electrical measurements (end-points) shall be in accordance with

table I, group A, subgroup 2.

4.4.3.1 Group C inspection, table E-VII (JANS) of MIL�PRF�19500.

Subgroup

Method

Condition

2036

Test condition E; not applicable for UB devices.

See 1.3. RθJC is applicable for all devices except UB. RθJA is applicable for UB devices.

3131

1,000 hours, VCB = 10 V dc, power and ambient temperature shall be applied to the device

1026

to achieve TJ = +150�C minimum, and minimum power dissipation of 75 percent of max

rated PT (see 1.3 herein); n = 45, c = 0. The sample size may be increased and the test

time decreased as long as the devices are stressed for a total of 45,000 device hours

minimum, and the actual time of test is at least 340 hours.

4.4.3.2 Group C inspection, (JAN, JANTX, and JANTXV), table E-VII of MIL�PRF�19500.

Subgroup

Method

Condition

2036

Test condition E; not applicable for UB devices.

See 1.3, RθJC is applicable for all devices except UB. RθJA is applicable for UB devices.

3131

Not applicable.

4.4.3.3 Group C sample selection. Samples for subgroups in group C shall be chosen at random from any

inspection lot containing the intended package type and lead finish procured to the same specification which is

submitted to and passes table I, group A tests herein for conformance inspection. When the final lead finish is solder

or any plating prone to oxidation at high temperature, the samples for C6 life test may be pulled prior to the

application of final lead finish. Testing of a subgroup using a single device type enclosed in the intended package

type shall be considered as complying with the requirements for that subgroup.

* 4.4.4 Group D inspection. Conformance inspection for hardness assured JANS and JANTXV types shall include

the group D tests specified in table II herein. These tests shall be performed as required in accordance with

MIL�PRF�19500 and method 1019 of MIL�STD�750 for total ionizing dose, or method 1017 of MIL�STD�750 for

neutron fluence as applicable (see 6.2.e herein), except group D, subgroup 2 may be performed separate from other

subgroups. Alternate package options may also be substituted for the testing provided there is no adverse effect to

the fluence profile.