MIL-PRF-19500/396L
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as
specified herein. If alternate screening is being performed in accordance with MIL-PRF-19500, a sample of
screened devices shall be submitted to and pass the requirements of table I, subgroups 1 and A2, inspection only
(table E-VIb, group B, subgroup 1 is not required to be performed again if group B has already been satisfied in
accordance with 4.4.2 herein).
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with table E-V of
MIL-PRF-19500 and table I herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VIa (JANS) of MIL-PRF-19500 and 4.4.2.1 herein. Electrical measurements (end-points)
and delta requirements shall be in accordance with table I, subgroup 2 and 4.5.2 herein except for thermal
impedance. See 4.4.2.2 for JAN, JANTX, and JANTXV group B testing. Electrical measurements (end-points) and
delta requirements for JAN, JANTX, and JANTXV shall be after each step in 4.4.2.2 and shall be in accordance with
table I, subgroup 2 and 4.5.2 herein.
4.4.2.1 Group B inspection, table E-VIa (JANS) of MIL-PRF-19500.
Subgroup
Method
Conditions
B4
1037
VCB = 10 - 30 V dc.
B5
1027
(NOTE: If a failure occurs, resubmission shall be at the test conditions of the original
sample.) VCB = 10 V dc, PD ≥ 100 percent of maximum rated PT (see 1.3).
Option 1: 96 hours minimum, sample size in accordance with table E-VIa of
MIL-PRF-19500 adjust TA or PD to achieve TJ = +275°C minimum.
Option 2: 216 hrs minimum, sample size = 45, c = 0; adjust TA or PD to achieve
TJ = +225°C minimum.
B6
3131
RθJA for TO-5, UA, RθJC for U4.
4.4.2.2 Group B inspection, (JAN, JANTX, and JANTXV). Separate samples may be used for each step. In the
event of a lot failure, the resubmission requirements of MIL-PRF-19500 shall apply. In addition, all catastrophic
failures during CI shall be analyzed to the extent possible to identify root cause and corrective action.
Step
Method
Condition
1
1039
Steady-state life: Test condition B, 1,000 hours minimum, VCB = 10 V dc, power shall
be applied to achieve TJ = +150°C minimum using a minimum of PD = 75 percent of
maximum rated PT as defined in 1.3. n = 45 devices, c = 0.
2
1039
HTRB: Test condition A, 48 hours minimum. n = 45 devices, c = 0.
High-temperature life (non-operating), t = 340 hours, TA = +200°C. n = 22, c = 0.
3
1032
10
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