MIL-PRF-19500/396L
* TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Limit
Unit
Symbol
Method
Conditions
Min
Max
Subgroup 2 Continued
Base to emitter voltage
3066
Test condition A; IC = 150 mA dc;
1.0
V dc
VBE(SAT)2
(saturated)
IB = 15 mA dc; pulsed (see 4.5.1)
Base to emitter voltage
3066
Test condition A; IC = 500 mA dc;
1.2
V dc
VBE(SAT)3
(saturated)
IB = 50 mA dc, pulsed (see 4.5.1)
Base to emitter voltage
3066
Test condition A; IC = 1.0 A dc;
.90
1.40
V dc
VBE(SAT)4
(saturated)
IB = 100 mA dc, pulsed (see 4.5.1)
Subgroup 3
TA = +150°C
High-temperature
operation
µA dc
Collector to emitter cutoff
3041
150
Bias condition A; VEB = 2 V dc;
ICEX2
current.
2N3762, 2N3764
VCE = 20 V dc;
2N3763, 2N3765
VCE = 30 V dc
TA = -55°C
Low-temperature
operation
Forward-current transfer
3076
20
VCE = 1.0 V dc; IC = 500 mA dc; pulsed
hFE6
ratio
(see 4.5.1)
Subgroup 4
Magnitude of common
3306
VCE = 10 V dc; IC = 50 mA dc;
|hfe|
emitter, small - signal
f = 100 MHz
short - circuit
forward - current transfer
ratio.
2N3762, 2N3764
1.8
6.0
2N3763, 2N3765
1.5
6.0
Open circuit output
3236
25
pF
VCB = 10 V dc; IE = 0;
Cobo
100 kHz ≤ f ≤ 1 MHz
capacitance
Input capacitance (output
3240
80
pF
VEB = .5 V dc; IC = 0;
Cibo
100 kHz ≤ f ≤ 1 MHz
open - circuited)
See footnotes at end of table.
15
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