MIL-PRF-19500-397 Semiconductor Device, Transistor, Pnp, Silicon, Types 2N3743, 2N3743U4, 2N4930, 2N4930U4, 2N4931, And 2N4931U4, Jan, Jantx, Jantxv, Jans, Janhc, And JankcThis specification covers the performance requirements for PNP, silicon, high-voltage transistor. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Two levels of product assurance for die are provided for each unencapsulated device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/397J

* TABLE I. Group A inspection. - Continued.

Inspection 1/

MIL-STD-750

Limit

Unit

Symbol

Method

Conditions

Min

Max

Subgroup 5

Safe operating area

3051

TC = +25�C, t ≥ 1 second,

(dc operation)

1 cycle

Test 1

IC = 50 mA dc, VCE = 20 V dc

Test 2

IC = 10 mA dc, VCE = 100 V dc

Test 3

2N3743, U4

IC = 3.3 mA dc, VCE = 300 V dc

2N4930, U4

IC = 5 mA dc, VCE = 200 V dc

2N4931, U4

IC = 4 mA dc, VCE = 250 V dc

Electrical measurements

See table I, subgroup 2 herein

1/ For sampling plan, see MIL-PRF-19500.

2/ For resubmission of failed subgroup 1, double the sample size of the failed test or sequence of tests.

3/ Separate samples may be used.

4/ Not required for JANS.

5/ Not required for laser marked devices.

6/ This test required for the following end-point measurements only:

Group B, subgroups 3, 4, and 5 (JANS).

Group B, see 4.4.2.2 herein, after each step (JAN, JANTX, and JANTXV).

Group C, subgroup 2 and 6.

Group E, subgroup 1.