MIL-PRF-19500/397J
* 4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VIa (JANS) and 4.4.2.1 herein. Electrical measurements (end-points) shall be in
accordance with table I, subgroup 2 herein. See 4.4.2.2 for JAN, JANTX, and JANTXV group B testing. Electrical
measurements (end-points) JAN, JANTX, and JANTXV shall be after each step in 4.4.2.2 and shall be in accordance
with table I, subgroup 2 herein.
*
4.4.2.1 Group B inspection, table E-VIa (JANS) of MIL-PRF-19500.
Subgroup
Method
Condition
VCE = 30 V dc, 2,000 cycles.
B4
1037
B5
1027
(NOTE: If a failure occurs, resubmission shall be at the test conditions of the
original sample). VCB = 10 V dc; PD ≥ 100 percent of maximum rated PT (see
1.3).
Option 1: 96 hours minimum, sample size in accordance with table E-VIa of
MIL-PRF-19500, adjust TA or PD to achieve TJ = +275°C minimum.
Option 2: 216 hours, sample size = 45, c = 0; adjust TA or PD to achieve
TJ = +225°C minimum.
4.4.2.2 Group B inspection, (JAN, JANTX, and JANTXV). Separate samples may be used for each step. In the
event of a lot failure, the resubmission requirements of MIL-PRF-19500 shall apply. In addition, all catastrophic
failures during CI shall be analyzed to the extent possible to identify root cause and corrective action.
Step
Method
Condition
Steady-state life: Test condition B, 1,000 hours minimum, VCB = 10 V dc,
1
1039
power shall be applied to achieve TJ = +175°C minimum using a minimum of
PD = 75 percent of maximum rated PT as defined in 1.3. n = 45 devices, c = 0.
2
1039
HTRB: Test condition A, 48 hours minimum. n = 45 devices, c = 0.
High-temperature life (non-operating), TA = +200°C. n = 22, c = 0.
3
1032
* 4.4.2.3 Group B sample selection. Samples selected from group B inspection shall meet all of the following
requirements:
a. For JAN, JANTX, and JANTXV samples shall be selected randomly from a minimum of three wafers (or from
each wafer in the lot) from each wafer lot. For JANS, samples shall be selected from each inspection lot. See
MIL-PRF-19500.
b. Shall be chosen from an inspection lot that has been submitted to and passed table I, subgroup 2,
conformance inspection. When the final lead finish is solder or any plating prone to oxidation at high
temperature, the samples for life test (subgroups B4 and B5 for JANS, and group B for JAN, JANTX, and
JANTXV) may be pulled prior to the application of final lead finish.
* 4.4.3 Group C inspection, Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500 and in 4.4.3.1 (JANS) and 4.4.3.2 (JAN, JANTX, and JANTXV)
herein for group C testing. Electrical measurements (end-points) shall be in accordance with table I, subgroup 2
herein.
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