MIL-PRF-19500-402 Semiconductor Device, Transistor, Npn, Silicon, Power, Type 2N3739, Jan, Jantx, And JantxvThis specification covers the performance requirements for NPN, silicon, power transistors. Three levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/402F

NOTES:

1. Either a clamping circuit or clamping diode may be used.

2. The coil used shall provide a minimum inductance of 25 mH at 1 A with a maximum

dc resistance of 1 ohm. For reference only: Triad C-48u (center-tapped), or equivalent (see 4.4.5)

3. RS  1 ohm, 12 W, 1% tolerance max., (noninductive).

Procedure:

1. With switch Sl closed, set the specified test conditions.

2. Open S1. Device fails if clamp voltage not reached and maintained until the current returns to zero.

3. Perform specified endpoint tests.

FIGURE 6. Clamped inductive sweep test circuit.