MIL-PRF-19500/415A
TABLE I. Group A inspection.
1/
MIL-STD-750
Limit
Unit
Inspection
Symbol
Method
Conditions
Min
Max
Subgroup 1
Visual and mechanical
2071
n = 45 devices, c = 0
examination
Subgroup 2
Breakdown voltage, collector to
3011
Bias condition D; IC = 10 mA dc;
BVCEO
emitter
pulsed (see 4.5.1)
2N2812
60
V dc
2N2814
80
V dc
Breakdown voltage, collector to
3011
Bias condition D; IC = 100 mA dc,
BVCEO
emitter
pulsed (see 4.5.1)
2N2812
60
V dc
2N2814
80
V dc
Bias condition D; IC = 10 µA dc
Breakdown voltage, collector to
3001
BVCBO
base
2N2812
80
V dc
2N2814
120
V dc
Bias condition D; IE = 10 µA dc
Breakdown voltage, emitter to
8.0
V dc
3026
BVEBO
base
µA dc
Collector to emitter cutoff
10
3041
Bias condition D; VCE = 50 V dc
ICEO
current
Collector to emitter cutoff
3041
Bias condition A; VEB = 0.5 V dc
ICEX1
current
µA dc
2N2812
1.0
VCE = 80 V dc
µA dc
2N2814
1.0
VCE = 120 V dc
Collector to base cutoff current
3036
Bias condition D
ICBO
µA dc
2N2812
0.1
VCB = 60 V dc
µA dc
2N2814
0.1
VCB = 80 V dc
µA dc
0.1
Emitter to base, cutoff current
3061
Bias condition D; VEB = 6 V dc
IEBO
Forward-current transfer ratio
3076
50
150
VCE = 5.0 V dc; IC = 1.0 A dc;
hFE1
pulsed (see 4.5.1)
Forward-current transfer ratio
3076
40
120
VCE = 5.0 V dc; IC = 5.0 A dc;
hFE2
pulsed (see 4.5.1)
15
Forward-current transfer ratio
3076
VCE = 5.0 V dc; IC = 10 A dc;
hFE3
pulsed (see 4.5.1)
10
Forward-current transfer ratio
3076
VCE = 5.0 V dc; IC = 10 mA dc;
hFE4
pulsed (see 4.5.1)
1.2
V dc
Base to emitter voltage (non-
3066
VBE
Test condition B; VCE = 5.0 V dc,
saturated)
IC = 5.0 A dc, pulsed (see 4.5.1)
See footnotes at end of table.
7
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