MIL-PRF-19500/415A
TABLE I. Group A inspection - Continued.
1/
MIL-STD-750
Limit
Unit
Inspection
Symbol
Method
Conditions
Min
Max
Subgroup 2 - continued
1.2
V dc
Base to emitter voltage
3066
Test condition A; IC = 5.0 A dc,
VBE(sat)1
(saturated)
IB = 0.5 A dc, pulsed (see 4.5.1)
2.0
V dc
Base to emitter voltage
3066
Test condition A; IC = 10 A dc,
VBE(sat)2
(saturated)
IB = 1.0 A dc, pulsed (see 4.5.1)
Collector to emitter voltage
0.5
V dc
3071
IC = 5.0 A dc, IB = 0.5 A dc,
VCE(sat)1
(saturated)
pulsed (see 4.5.1)
Collector to emitter voltage
3071
1.5
V dc
IC = 10 A dc, IB = 1.0 A dc,
VCE(sat)2
(saturated)
pulsed (see 4.5.1)
Subgroup 3
TA = +150°C
High temperature operation
Collector to emitter cutoff
3041
Bias condition A; VEB = 0.5 V dc
ICEX2
current
µA dc
2N2812
50
VCE = 60 V dc
µA dc
2N2814
50
VCE = 80 V dc
TA = -55°C
Low temperature operation
20
Forward-current transfer ratio
3076
hFE5
VCE = 5.0 V dc; IC = 5.0 A dc;
pulsed (see 4.5.1)
Subgroup 4
Magnitude of small-signal
| hfe |
1.5
7.0
3306
VCE = 10 V dc; IC = 1.0 A dc;
short- circuit forward current
f = 10 MHz
transfer ratio
40
150
Small-signal short-circuit
3206
VCE = 5.0 V dc; IC = 50 mA dc
hfe
forward current transfer ratio
f = 1 kHz
350
pF
Open circuit output capacitance
3236
Cobo
VCB = 10 V dc; IE = 0,
100 kHz ≤ f ≤ 1 MHz
Pulse response
3251
See figure 2
400
ns
Turn-on time
VCC = 25.5 V dc; VBB = 5.0 V dc;
tON
IC = 5.0 A dc; IB1 = 0.5 A dc
1,000
ns
Storage time
VCC = 25.5 V dc; VBB = 5.0 V dc;
tS
IC = 5.0 A dc; IB1 = IB2 = 0.5 A dc
400
ns
Fall time
VCC = 25.5 V dc; VBB = 5.0 V dc;
tF
IC = 5.0 A dc; IB1 = IB2 = 0.5 A dc
See footnotes at end of table.
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