MIL-PRF-19500/434E
3.6 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table I.
3.7 Workmanship. Semiconductor devices shall be processed in such a manner as to be uniform in quality and
shall be free from other defects that will affect life, serviceability, or appearance.
4. VERIFICATION
4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:
a. Qualification inspection (see 4.2).
b. Screening (see 4.3).
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as specified
herein.
4.2.1 Group E qualification. Group E inspection shall be performed for qualification or re-qualification only. In
case qualification was awarded to a prior revision of the specification sheet that did not require the performance of
table IV tests, the tests specified in table IV herein that were not performed in the prior revision shall be performed
on the first inspection lot of this revision to maintain qualification.
4.3 Screening (JANS, JANTX, and JANTXV levels only). Screening shall be in accordance with table E-IV of
MIL-PRF-19500, and as specified herein. The following measurements shall be made in accordance with table I
herein. Devices that exceed the limits of table I herein shall not be acceptable.
Screen
(see table E-IV of
Measurement
JANS level
JANTX and JANTXV levels
T(high) = +175°C
T(high) = +175°C
3
9
Not applicable
Not applicable
10
Not applicable
Not applicable
11
Not applicable
Not applicable
12
See 4.5.1
See 4.5.1
13
Interim electrical, delta, and table I,
Interim electrical, delta, and table I,
subgroup 2 and 3 electrical parameters
subgroup 2 and 3 electrical parameters not
not applicable for this screen (performed
applicable for this screen (performed in
in screen 12).
screen 12).
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500 and table I
herein. End-point electrical measurements shall be in accordance with the applicable steps of table II herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VIA (JANS) and table E-VIB (JAN, JANTX, and JANTXV) of MIL-PRF-19500. Electrical
measurements (end-points) and delta requirements shall be in accordance with the applicable steps of table II
herein.
4.4.2.1 Group B inspection, table E-VIA (JANS) of MIL-PRF-19500. Subgroup 5: Condition for accelerated
steady-state operation life are as follows: See 4.5.2, TA = +100°C (min); 1 ms pulse only (see 4.5.3.b).
4
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