MIL-PRF-19500/434E
4.4.2.2 Group B inspection, table E-VIB (JAN, JANTX, and JANTXV of MIL-PRF-19500. Subgroup 3: Condition
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500. Electrical measurements (end-points) and delta requirements
shall be in accordance with the applicable steps of table II herein.
4.4.3.1 Group C inspection, table E-VII of MIL-PRF-19500.
a. Subgroup 2: The conditions for terminal strength are as follows: Lead tension: Test condition A;
weight = 5 pounds; t = 15 ±3 s.
Lead fatigue: Test condition E; weight = 8 ounces.
b. Subgroup 6: The condition for steady-state operation life is as follows: See 4.5.1, 1 ms pulse only (see
4.5.3.b).
c. Subgroup 8: The conditions for temperature coefficient of breakdown voltage are as follows: I(BR) =
column 3 of table III, T1 = +25°C ±3°C, T2 = T1 +100°C, sample size n = 22, c = 0.
d. Subgroup 8: The conditions for maximum peak pulse current are as follows: See 4.5.3.a (20 µs pulse only)
ten pulses, sample size n = 22, c = 0.
* 4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-IX of MIL-PRF-19500 and as specified in table IV herein. Electrical
measurements (end-points) shall be in accordance with table I, subgroup 2 herein.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables as follows.
4.5.1 Power burn-in (HTRB) and steady-state operation life test conditions. The test conditions and order of
events shall be as follows:
a. Pulse in accordance with 4.5.3.b, 20 times (screening and group B) and 100 times (group C) at TA = +25°C.
b. Read ID and V(BR) at TA = +25°C, remove defective devices and record the number of failures.
c. Apply the working peak reverse voltage (VWM) (column 4 of table III) at TA = +125°C as follows:
(1) For 96 hours (JANTX and JANTXV) and 240 hours (JANS) for the screening test.
(2) For 340 hours (JANTX, and JANTXV) for group B steady-state operation life test.
(3) For 1,000 hours for group C steady-state operation life test.
d. Read and record ID and V(BR) at TA = +25°C. Devices with ĆID > 50 percent (100 percent for steady-state
operation life) of the initial reading or 1 µA dc, whichever is greater, or ĆV(BR) > ±2 percent (±5 percent for
steady-state operation life) initial value shall be considered defective. Remove defective devices and record
the number of failures.
4.5.1.1 Group C steady-state operation life test (alternate procedure). When the group B 340 hour life test is
continued on test to 1,000 hours to satisfy the group C life test requirements, the test shall be performed as given in
4.5.1 herein with the following exceptions:
a. See 4.5.1 herein, step b shall be moved and performed following step e.
b. See 4.5.1 herein, step e shall be repeated after step b is performed.
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