MIL-PRF-19500-439 Semiconductor Device, Transistor, Npn, Silicon, High-Power, Types 2N5038 And 2N5039, Jan, Jantx, Jantxv, Jans, Janhc, And JankcThis specification covers the performance requirements for NPN silicon, high-power transistors for use in high-speed power-switching applications. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500, and two levels of product assurance are provided for each unencapsulated device type.

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MIL-PRF-19500/439H

TABLE II. Group E inspection (all quality levels) for qualification and re-qualification only.

Inspection

MIL-STD-750

Qualification

conformance

Method

Conditions

inspection

45 devices

Subgroup 1

c=0

Temperature cycling

1051

500 cycles

Hermetic seal

1071

Fine leak

Gross leak

Electrical measurements

Table I, subgroup 2 and 4.5.3 herein. See

steps 1, 2 and 3

45 devices

Subgroup 2

c=0

High temperature reverse bias

1039

Condition A; 1,000 hours

Electrical measurements

Table I, subgroup 2 and 4.5.3 herein. See

step 2.

Subgroup 3

Not applicable

Subgroup 4

Thermal impedance curves

Subgroup 5

Not applicable

Subgroup 8

45 devices

c=0

Reverse stability

1033

Condition B