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MIL-PRF-19500-439 Semiconductor Device, Transistor, Npn, Silicon, High-Power, Types 2N5038 And 2N5039, Jan, Jantx, Jantxv, Jans, Janhc, And JankcThis specification covers the performance requirements for NPN silicon, high-power transistors for use in high-speed power-switching applications. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500, and two levels of product assurance are provided for each unencapsulated device type.

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MIL-PRF-19500/439H
* 4.4.2.2 Group B inspection, table E-VIB (JAN, JANTX, and JANTXV). Electrical end-points shall be in accordance with
table I, subgroup 2, and 4.5.3 herein.
Subgroup
Method
Condition
*
B3
2037
Test condition D
2,000 cycles; VCB = 10 V dc; ĆTJ between cycles ≥ +100°C; ton = toff ≥ 1 minute
B3
1037
See 4.5.2, RΘJC shall be 1.25°C/W.
B5
3131
B
Load condition C; (unclamped inductive load) (see figure 5); TC = +25°C; duty cycle ≤ 10
3053
7
percent; Rs = 0.1Ω; tr = tp ≤ 500 ns, for qualification and large lot QCI, sample size = 22, c =
0; for small lot QCI, sample size = 6, c = 0.
TEST 1: tp = 5 ms (vary to obtain IC); RBB1 = 2Ω; VBB1 = 10 V dc minimum;
*
RBB2 = 20Ω; VBB2 = 4 V dc; VCC = 10 V dc; IC = 20 A; L = 70 µH, 0.1Ω.
TEST 2: tp = 5 ms (vary to obtain IC); RBB1 = 40Ω; VBB1 = 10 V dc minimum;
*
RBB2 = 20Ω; VBB2 = 4 V dc; VCC = 10 V dc; IC = 4.5 A; L = 500 µH, 0.1Ω.
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500 and as follows. Electrical measurements (end-points) and delta
requirements shall be in accordance with table I, subgroup 2. Delta requirements shall be in accordance with 4.5.3
herein.
4.4.3.1 Group C inspection, table E-VII of MIL-PRF-19500.
Subgroup
Method
Condition
C2
1056
Test condition B.
C2
2036
Test condition A, weight = 10 lbs., t = 15 s.
6,000 cycles; VCB = 10 V dc; ĆTJ between cycles ≥ +100°C; ton = toff ≥ 1 minute.
C6
1037
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the tests and conditions
specified for subgroup testing in table E-IX of MIL-PRF-19500, and table II herein. Electrical measurements (end-
points) and delta measurements shall be in accordance with table I, subgroup 2 herein and 4.5.3 herein.
4.5 Method of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.
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