MIL-PRF-19500-448 Semiconductor Device, Transistor, Pnp, Silicon, Low-Power, Type 2N4405, 2N4405Ua, And 2N4405Ub, Jan And JantxThis specification covers the performance requirements for PNP, silicon, low-power transistors. Two levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/448F

TABLE II. Group E inspection (all quality levels) - for qualification and requalification only.

MIL-STD-750

Inspection

Qualification

Method

Conditions

Subgroup 1

45 devices

c=0

Temperature cycling

1051

Test condition C, 500 cycles

(air to air)

Hermetic seal

1071

Fine leak

Gross leak

Electrical measurements

See table 1, subgroup 2 and table III herein.

Subgroup 2

45 devices

c=0

Intermittent life

1037

VCB = 10 V dc, 6,000 cycles

Electrical measurements

See table 1, subgroup 2 and table III herein.

Subgroup 4

Thermal resistance

3131

15 devices,

RθJSP(IS) can be calculated but shall be measured

c=0

once in the same package with a similar die size to

confirm calculations (may apply to specification

sheets).

RθJSP(AM) need be calculated only.

Thermal impedance curves

See MIL-PRF-19500, table E-IX, group E,

subgroup 4.

Subgroup 5

Not applicable

Subgroup 6

ESD

1020

Subgroup 8

Reverse stability

1033

Condition B < 400 V

45 devices

c=0