MIL-PRF-19500-448 Semiconductor Device, Transistor, Pnp, Silicon, Low-Power, Type 2N4405, 2N4405Ua, And 2N4405Ub, Jan And JantxThis specification covers the performance requirements for PNP, silicon, low-power transistors. Two levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/448F

4.3 Screening JANTX level. Screening shall be in accordance with table IV of MIL-PRF-19500 and as specified

herein. The following measurements shall be made in accordance with table I herein. Devices that exceed the limits

of table I herein shall not be acceptable.

Screen (see table E-IV of

Measurement

MIL-PRF-19500)

JANTX level only

Method 3131of MIL-STD-750, thermal impedance. See 4.3.2.

(1) 3c

Not applicable

hFE2 and ICBO2

Subgroup 2 of table I herein, ĆICBO2 = 100 percent of initial value or

10 nA dc, whichever is greater; ĆhFE2 = �20 percent of initial value.

(1) Shall be performed anytime after temperature cycling, screen 3a; and does not need to be repeated in

screening requirements.

4.3.1 Power burn-in conditions. Power burn-in conditions are as follows: VCB = 10 - 30 Vdc. Power shall be

applied to achieve TJ =+135�C minimum and a minimum PD = 75 percent of PT maximum rated as defined in 1.3.

4.3.2 Thermal impedance (ZθJX measurements). The ZθJX measurements shall be performed in accordance with

method 3131 of MIL-STD-750 using the guidelines in that method for determining IM, IH, tH, tMD, (and VC where

appropriate). The ZθJX limit used in screen 3c of 4.3 and subgroup 2 of table I shall comply with the thermal

impedance graph in figures 9, 10, 11, 12, and 13 (less than or equal to the curve value at the same tH time) and shall

be less than the process determined statistical maximum limit as outlined in method 3131.

4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500, and as

specified herein. Group A inspection shall be performed on each sublot.

4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500 and table I

herein.

4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the tests and conditions

specified in 4.4.2.1 for JAN and JANTX group B testing. Electrical measurements (end-points) and delta

requirements for JAN and JANTX shall be after each step in 4.4.2.1 and shall be in accordance with table I, group A,

subgroup 2. Delta measurements shall be in accordance with table III herein as specified in the notes for table III.