MIL-PRF-19500/448F
TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Symbol
Limits
Unit
Method
Conditions
Min
Max
Subgroup 4
Delay time
15
ns
td
VCC = 31.9 V dc; VBE(OFF) = 0.8 V dc;
IC = 500 mA dc; IB1 = 50 mA dc;
(see figure 14)
Rise time
25
ns
tr
VCC = 31.9 V dc; VBE(OFF) = 0.8 V dc;
IC = 500 mA dc; IB1 = 50 mA dc;
(see figure 14)
Storage time
VCC = 31.9 V dc; IC = 500 mA dc;
175
ns
ts
Fall time
50
ns
tf
VCC = 31.9 V dc; IC = 500 mA dc;
Magnitude of common emitter,
3306
2.0
6
VCE = 20 V dc; IC = 50 mA dc;
|hFE|
small- signal short-circuit
f = 100 MHz
forward current transfer ratio
Noise figure
3246
NF
3.5
dB
VCE = 10 V dc; IC = 1 mA dc;
f = 1 kHz; Rs = 100 ohms
Open circuit output
3236
20
pF
VCB = 10 V dc; IE = 0 mA dc
Cobo
100 kHz ≤ f ≤ 1 MHz
capacitance
Subgroup 5
TC = +25°C; VCE = 10 V dc;
Safe operating area
3051
(continuous dc)
IC = 0.5 A dc; t = 1 s; 1 cycle
Electrical measurements
See table I, subgroup 2
1/ For sampling plan, see MIL-PRF-19500.
2/ For resubmission of failed subgroup 1, double the sample size of the failed test or sequence of tests. A failure
in table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun upon
submission.
3/ Separate samples may be used.
4/ Not required for laser marked devices.
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