MIL-PRF-19500/448F
4.4.2.1 Group B inspection, (JAN and JANTX). Separate samples may be used for each step. In the event of a
group B failure, the manufacturer may pull a new sample at double size from either the failed assembly lot or from
another assembly lot from the same wafer lot. If the new "assembly lot" option is exercised, the failed assembly lot
shall be scrapped.
Step
Method
Condition
Steady-state life: 1,000 hours minimum, VCB = 10 V dc, power shall be
1
1026
applied to achieve TJ = +150°C minimum using a minimum of PD = 75
sample size may be increased and the test time decreased as long as the
devices are stressed for a total of 45,000 device hours minimum, and the
actual time of test is at least 340 hours.
Blocking life: TA = 150°C, VCB = 80 percent rated voltage, 48 hours
2
1048
minimum. n = 45, c = 0.
High-temperature life (non-operating), t = 340 hours, TA = +200°C. n = 22,
3
1032
c = 0.
4.4.2.2 Group B sample selection. Samples selected from group B inspection shall meet all of the following
requirements:
a. For JAN and JANTX, samples shall be selected randomly from a minimum of three wafers (or from each wafer
in the lot) from each wafer lot. See MIL-PRF-19500.
b. Shall be chosen from an inspection lot that has been submitted to and passed table I, subgroup 2,
conformance inspection. When the final lead finish is solder or any plating prone to oxidation at high
temperature, the samples for life test (group B for JAN and JANTX) may be pulled prior to the application of
final lead finish.
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500. Electrical measurements (end-points) and delta requirements
shall be in accordance with the applicable steps of table III herein.
Subgroup
Method
Condition
*
C2
2036
Test condition E, not applicable for UA and UB devices.
C5
3131
RθJA only.
C6
Not applicable.
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-IX of MIL-PRF-19500 and as specified herein. Electrical measurements (end-points) and
delta measurements shall be in accordance with the applicable steps of table III and table I, subgroup 2 herein.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows:
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of
MIL-STD-750.
8
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