MIL-PRF-19500/474G
3.3 Abbreviations, symbols, and definitions. Abbreviations, symbols, and definitions used herein shall be as
specified in MIL-PRF-19500 and as follows.
IRi
-
Isolation current between any two interconnect pins of adjacent parallel sets of diodes with all other
pins open circuited.
IRX
-
Reverse current for each diode of test section.
Vfr
-
Forward recovery voltage. Specified maximum forward voltage used to determine forward recovery
time.
VFX
-
Forward voltage for each diode of test section.
3.4 Interface and physical dimension. The interface and physical dimension shall be as specified in
MIL-PRF-19500, and figures 1, 2, 3, 4, 5, 6, 7, and 8. Schematic diagrams are specified in figure 9. No organic or
polymeric materials shall be used.
3.4.1 Lead material and finish. Lead material shall be Kovar, F-15 alloy, or alloy 42 as specified in ASTM F30.
Lead finish shall be gold-plated or solderable in accordance with MIL-PRF-19500. Where a choice of lead material
of finish is desired, it shall be specified in the contract or order (see 6.2).
3.4.2 Die mounting. Pure glass shall not be used for die mounting. Metal glass die mounting is acceptable with
qualifying activity approval for die with area greater than 1,000 square mils.
3.5 Marking. Devices shall be marked as specified in MIL-PRF-19500.
3.6 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance
characteristics are as specified in 1.3, 1.4, and table I.
3.7 Electrical test requirements. The electrical test requirements shall be as specified in table I herein.
3.8 Workmanship. Semiconductor devices shall be processed in such a manner as to be uniform in quality and
shall be free from other defects that will affect life, serviceability, or appearance.
4. VERIFICATION
4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:
a. Qualification inspection (see 4.2).
b. Screening (see 4.3).
c. Conformance inspection (see 4.4).
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as
specified herein.
4.2.1 Group E qualification. Group E inspection shall be performed for qualification or re-qualification only. In
case qualification was awarded to a prior revision of the specification sheet that did not require the performance of
table II tests, the tests specified in table II herein that were not performed in the prior revision shall be performed on
the first inspection lot of this revision to maintain qualification.
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