For Parts Inquiries call (727) 344-9615
A Service Disabled Veteran Owned Small Business
© Copyright 2015 Integrated Publishing, Inc.

MIL-PRF-19500-488 Semiconductor Device, Transistor, Npn, Silicon, High-Power, Types 2N5671 And 2N5672, Jan, Jantx, Jantxv, And JansThis specification covers the performance requirements for NPN, silicon, high-power transistors. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14 - 15


img
MIL-PRF-19500/488E
* TABLE II. Group E inspection (all quality levels) ­ for qualification or re-qualification only.
Inspection
MIL-STD-750
Sample
plan
Method
Conditions
Subgroup 1
45 devices
c=0
Temperature cycling
1051
Test condition C, 500 cycles.
(air to air)
Hermetic seal
1071
Fine leak
Test conditions G or H.
Gross leak
Test conditions C or D.
Electrical measurements
See table I, subgroup 2.
Subgroup 2
45 devices
c=0
Test temperature = +125C; VCB = 80 percent of
Blocking life
1048
rated; T = 1,000 hours.
Electrical measurements
See table I, subgroup 2.
Subgroup 4
Sample size
N/A
See MIL-PRF-19500.
Thermal impedance curves
Subgroup 8
45 devices
c=0
Reverse stability
1033
Condition B.
11



For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business

© Copyright 2015 Integrated Publishing, Inc. Site Design & Marketing by Strategico.