MIL-PRF-19500/507F
TABLE I. Group A inspection.
Inspection 1/
Symbol
Limits 2/
Unit
Method
Conditions
Min
Max
Subgroup 1
Visual and mechanical
2071
examination
Radiography
2076
For JANTX devices only -
Inspection will be in accordance
with manufacturer's internal failure
criteria, c = 45, n = 0
Subgroup 2 3/
µA
DC method, VR = VWM (column 4
4016
ID
Column 5
Standby current
table II)
tp ≤ 300 ms, duty cycle ≤ 2
Breakdown voltage
4022
VBR
Column 2
Column 2
V
percent, IBR = column 3 of table II
Subgroup 3 3/
TA = -55°C
Low temperature
operation:
tp ≤ 300 ms, duty cycle ≤ 2
Minimum breakdown
4022
VBR
Column 10
V
voltage
percent, IBR = column 3 of table II
TA = 125°C
High temperature
operation:
µA
Reverse current leakage
4016
DC method, VR = VWM, column 4
ID2
Column 9
of table II
Subgroup 4 3/
tp = 1.0 ms (see 4.5.2.a),
VC
Column 6
V
Clamping voltage
maximum (pulsed)
IPP = column 7 of table II
(see 4.5.3)
Subgroup 5, 6 and 7
Not applicable
1/ For sampling plan, see MIL-PRF-19500.
2/ Column references are to table II.
3/ All electrical testing shall be performed twice, once in each direction.
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