MIL-PRF-19500/554E
3.7 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance
characteristics are as specified in 1.3, 1.4, and table I.
3.8 Electrical test requirements. The electrical test requirements shall be specified in table I herein.
3.9 Workmanship. Semiconductor devices shall be processed in such a manner as to be uniform in quality and
shall be free from other defects that will affect life, serviceability, or appearance.
4. VERIFICATION
4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:
a. Qualification inspection (see 4.2).
b. Screening (see 4.3).
c. Conformance inspection (see 4.4).
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as specified
herein.
4.2.1 Group E qualification. Group E inspection shall be performed for qualification or requalification only. In case
qualification was awarded to a prior revision of the specification sheet that did not request the performance of table II
tests, the tests specified in table II herein that were not performed in the prior revision shall be performed on the first
inspection lot of this revision to maintain qualification.
4.2.2 JANHC devices. JANHC devices shall be qualified in accordance with MIL-PRF-19500.
* 4.3 Screening (JANTXV and JANTX levels only). Screening shall be in accordance with table E-IV of
MIL-PRF-19500, and as specified herein. The following measurements shall be made in accordance with table I
herein. Devices that exceed the limits of table I herein shall not be acceptable.
Screen
Measurement
(table E-IV of
JANTXV and JANTX levels
MIL-PRF-19500)
3a
Condition C
(1) 3b
Surge, see 4.3.2
3c
Thermal impedance, see 4.3.3
4
Not applicable
9
Not applicable
10
Not applicable
Reverse energy test (see 4.5.2), followed by VFM1 and IRM1
(2) 11
of table I, subgroup 2.
12
Burn-in, method 1038 of MIL-STD-750, test condition A; see
4.3.4.
FM1 and IRM1 of table 1, subgroup 2;
(3) 13
ĆVFM1 = 0.05 V (pk), ĆIRM1 = ±100 percent or 5 mA dc,
whichever is greater.
Scope display evaluation (see 4.5.3).
(1) Surge current shall precede thermal response. These tests shall be performed anytime after screen 3a and
before screen 10.
(2) IRM1 shall not be indicative of an open condition.
(3) All devices shall be subjected to the scope display evaluation test, and reverse energy test.
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