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MIL-PRF-19500-559 Semiconductor Device, Unitized, Npn, Silicon, Switching, Four Transistor Array, Types 2N6989, 2N6989U, And 2N6990, Jan, Jantx, Jantxv, Jans, Jansm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, And JanshThis specification covers the performance requirements for NPN, silicon, switching transistors in a four independent chip array. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Provisions for radiation hardness assurance \(RHA\) to eight radiation levels is provided for JANS product assurance levels. RHA level designators "M", "D", "P", "L", "R", "F", "G", and "H" are appended to the device prefix to identify devices, which have passed RHA requirements.

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MIL-PRF-19500/559K

1.4 Primary electrical characteristics. Characteristics apply to each transistor in the array.

hFE2 (1)

hFE4 (1)

Cobo

Limits

Switching

VCE = 10 V dc

VCB = 10 V dc

IC = 1.0 mA dc

IC = 150 mA dc

IE = 0

ton

toff

100 kHz ≤ f ≤ 1 MHz

(see figure 14)

(see figure 15)

Min

100

Max

325

300

|hFE|

VCE(sat)2 (1)

VBE(sat)2 (1)

Limits

VCE = 10 V dc

IC = 500 mA dc

IC = 20 mA dc

IB = 50 mA dc

f = 100 MHz

V dc

Min

2.5

Max

10.0

1.0

2.0

(1) Pulsed (see 4.5.1).

2. APPLICABLE DOCUMENTS

2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This

section does not include documents cited in other sections of this specification or recommended for additional

information or as examples. While every effort has been made to ensure the completeness of this list, document

users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this

specification, whether or not they are listed.

2.2 Government documents.

2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a

part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are

those cited in the solicitation or contract.

DEPARTMENT OF DEFENSE SPECIFICATIONS

MIL-PRF-19500

Semiconductor Devices, General Specification for.

DEPARTMENT OF DEFENSE STANDARDS

MIL-STD-750

Test Methods for Semiconductor Devices.

* (Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch or

https://assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D,

Philadelphia, PA 19111-5094.)

* 2.3 Order of precedence. Unless otherwise noted herein or in the contract, in the event of a conflict between the

text of this document and the references cited herein, the text of this document takes precedence. Nothing in this

document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained.