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MIL-PRF-19500-581 Semiconductor Device, Transistor, Npn, Silicon Amplifier, Types 2N4237, 2N4238, And 2N4239, Jan, Jantx, And JantxvThis specification covers the performance requirements for NPN, silicon, amplifier transistors. Three levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

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MIL­PRF­19500/581C
TABLE I. Group A inspection ­ Continued.
Limit
Inspection 1/
Symbol
Unit
Method
Conditions
Min
Max
Subgroup 5
TC = +25°C; t ≥ 0.5 s, 1 cycle
Safe operating area
3051
(continuous dc) 5/
IC = 1.0 A dc, VCE = 6 V dc
Test 1
IC = 500 mA dc, VCE = 12 V dc
Test 2
Test 3
IC = 166 mA dc, VCE = 30 V dc
2N4237
IC = 100 mA dc, VCE = 50 V dc
2N4238
IC = 71 mA dc, VCE = 70 V dc
2N4239
End-point electrical
See subgroup 2 of this table
measurements
Subgroups 6 and 7
Not applicable
1/
For sampling plan, see MIL­PRF­19500.
2/
For resubmission of failed subgroup 1, double the sample size of the failed test or sequence of tests. A failure in
subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun upon submission.
3/
Separate samples may be used.
4/
Not required for laser marked devices.
5/
L = 5 mH (2 each Essex Stancor C-2688 in parallel 1A, 0.5 ohm, or equivalent (see 4.5.2).
10



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