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MIL-PRF-19500-581 Semiconductor Device, Transistor, Npn, Silicon Amplifier, Types 2N4237, 2N4238, And 2N4239, Jan, Jantx, And JantxvThis specification covers the performance requirements for NPN, silicon, amplifier transistors. Three levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

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MIL­PRF­19500/581C
TABLE II. Group E inspection (all quality levels) ­ for qualification only.
Qualification
Inspection
sample plan
Method
Conditions
Subgroup 1
45 devices
c=0
Temperature cycling
1051
Test condition C, 500 cycles.
(air to air)
Hermetic seal
1071
Fine leak
Gross leak
Electrical measurements
See table I, subgroup 2 and 4.6 herein.
Subgroup 2
45 devices
c=0
VCB = 10 V dc, 6,000 cycles, forced air cooling
Intermittent life
1037
allowed on cooling cycle only.
Electrical measurements
See table I, subgroup 2 and 4.6 herein.
Sample size
Subgroup 4
N/A
Thermal impedance curves
Subgroup 5
Not applicable
45 devices
Subgroup 8
c=0
Reverse voltage leakage
1033
Condition B for devices < 400 V.
stability
11



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